Minimal exercise vector generation for reliability improvement

P. Madhukar Reddy, Stavros Hadjitheophanousi, Vassos Soteriou Soteriou, Paul V. Gratz, Maria K. Michael

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Negative Bias Temperature Instability (NBTI) is a prominent physical failure mechanism which severely degrades the performance of PMOS transistors whenever the voltage at the gate is negatively biased. It leads to catastrophic timing violations in critical circuits and a severe shortening of the overall operational lifetime of the entire system. To alleviate such damaging effects due to NBTI, we present PRITEXT, a novel technique which generates a minimal set of deterministic exercise vectors based on test generation techniques which inherently near-optimizes the bit patterns across each of the generated vectors; the end target being to exercise the critical paths of a device when dormant so as to achieve near-ideal NBTI stress reduction. We explore the design-space of our generated vectors and apply them to our test processor platform under differing sequences, where our evaluation under realistic benchmarks shows that PRITEXT leads to an average 4.99× and a maximum of 13.91× lifetime improvement using 9 generated vectors. In an attempt to reduce hardware overheads even further, we next propose a heuristic to further reduce the number of exercise vectors with minimum loss in lifetime improvement.

Original languageEnglish (US)
Title of host publication2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design, IOLTS 2017
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages113-119
Number of pages7
ISBN (Electronic)9781538603512
DOIs
StatePublished - Sep 19 2017
Event23rd IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2017 - Thessaloniki, Greece
Duration: Jul 3 2017Jul 5 2017

Other

Other23rd IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2017
CountryGreece
CityThessaloniki
Period7/3/177/5/17

Fingerprint

Transistors
Hardware
Networks (circuits)
Electric potential
Negative bias temperature instability

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Safety, Risk, Reliability and Quality
  • Computer Networks and Communications
  • Hardware and Architecture
  • Control and Systems Engineering

Cite this

Reddy, P. M., Hadjitheophanousi, S., Soteriou, V. S., Gratz, P. V., & Michael, M. K. (2017). Minimal exercise vector generation for reliability improvement. In 2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design, IOLTS 2017 (pp. 113-119). [8046205] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/IOLTS.2017.8046205

Minimal exercise vector generation for reliability improvement. / Reddy, P. Madhukar; Hadjitheophanousi, Stavros; Soteriou, Vassos Soteriou; Gratz, Paul V.; Michael, Maria K.

2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design, IOLTS 2017. Institute of Electrical and Electronics Engineers Inc., 2017. p. 113-119 8046205.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Reddy, PM, Hadjitheophanousi, S, Soteriou, VS, Gratz, PV & Michael, MK 2017, Minimal exercise vector generation for reliability improvement. in 2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design, IOLTS 2017., 8046205, Institute of Electrical and Electronics Engineers Inc., pp. 113-119, 23rd IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2017, Thessaloniki, Greece, 7/3/17. https://doi.org/10.1109/IOLTS.2017.8046205
Reddy PM, Hadjitheophanousi S, Soteriou VS, Gratz PV, Michael MK. Minimal exercise vector generation for reliability improvement. In 2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design, IOLTS 2017. Institute of Electrical and Electronics Engineers Inc. 2017. p. 113-119. 8046205 https://doi.org/10.1109/IOLTS.2017.8046205
Reddy, P. Madhukar ; Hadjitheophanousi, Stavros ; Soteriou, Vassos Soteriou ; Gratz, Paul V. ; Michael, Maria K. / Minimal exercise vector generation for reliability improvement. 2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design, IOLTS 2017. Institute of Electrical and Electronics Engineers Inc., 2017. pp. 113-119
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