Microscopy: Atomic Force Microscopy

C. J. Wright, L. C. Powell, D. J. Johnson, N. Hilal

Research output: Chapter in Book/Report/Conference proceedingChapter

Abstract

Atomic force microscopy (AFM) is an essential tool for the characterization of microbial surfaces. AFM has been used extensively for imaging and nanoscale measurements of microbial surface features. In addition, the instrument's force measurement capability has provided unique insight into the interactions of microbial systems at the macromolecular, cell, and biofilm level. The chapter introduces the technology and describes the application of AFM in key research examples relevant to food microbiology. The chapter closes with a look to the future and how AFM is being integrated with established and emerging technologies for the improved study of food and microbial surfaces.

Original languageEnglish (US)
Title of host publicationEncyclopedia of Food Microbiology
Subtitle of host publicationSecond Edition
PublisherElsevier Inc.
Pages666-675
Number of pages10
ISBN (Electronic)9780123847331
ISBN (Print)9780123847300
DOIs
StatePublished - Apr 2 2014

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Keywords

  • Atomic force microscopy
  • Biofilm
  • Colloid probe
  • Force measurement
  • Macromolecules
  • Mechanical properties
  • Nanoindentation
  • Nanoscience
  • Surface characterization
  • Viruses

ASJC Scopus subject areas

  • Medicine(all)

Cite this

Wright, C. J., Powell, L. C., Johnson, D. J., & Hilal, N. (2014). Microscopy: Atomic Force Microscopy. In Encyclopedia of Food Microbiology: Second Edition (pp. 666-675). Elsevier Inc.. https://doi.org/10.1016/B978-0-12-384730-0.00217-2