### Abstract

This paper describes an experimental comparison of two measures of the complexity of binary patterns with respect to how well they predict human judgement of visual complexity. The experiments are performed with a data set consisting of 45 binary patterns defined on a square 6×6 array of black and white squares. The measures compared are generalizations of the measures previously explored for one-dimensional binary sequences by Alexander and Carey as well as Papentin. The former is based on counting the number of sub-symmetries present in the pattern, and the latter is an upper bound on the Kolmogorov complexity. This upper bound is obtained by calculating the shortest length of all possible descriptions of the pattern among a hierarchy of description languages.

Original language | English (US) |
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Title of host publication | Proceedings of the 14th IAPR International Conference on Machine Vision Applications, MVA 2015 |

Publisher | Institute of Electrical and Electronics Engineers Inc. |

Pages | 480-483 |

Number of pages | 4 |

ISBN (Electronic) | 9784901122153 |

DOIs | |

State | Published - Jan 1 2015 |

Event | 14th IAPR International Conference on Machine Vision Applications, MVA 2015 - Tokyo, Japan Duration: May 18 2015 → May 22 2015 |

### Other

Other | 14th IAPR International Conference on Machine Vision Applications, MVA 2015 |
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Country | Japan |

City | Tokyo |

Period | 5/18/15 → 5/22/15 |

### Fingerprint

### ASJC Scopus subject areas

- Computer Science Applications
- Computer Vision and Pattern Recognition

### Cite this

*Proceedings of the 14th IAPR International Conference on Machine Vision Applications, MVA 2015*(pp. 480-483). [7153235] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/MVA.2015.7153235

**Measuring the complexity of two-dimensional binary patterns - Sub-symmetries versus Papentin complexity.** / Toussaint, Godfried; Onea, Noris S.; Vuong, Quan H.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

*Proceedings of the 14th IAPR International Conference on Machine Vision Applications, MVA 2015.*, 7153235, Institute of Electrical and Electronics Engineers Inc., pp. 480-483, 14th IAPR International Conference on Machine Vision Applications, MVA 2015, Tokyo, Japan, 5/18/15. https://doi.org/10.1109/MVA.2015.7153235

}

TY - GEN

T1 - Measuring the complexity of two-dimensional binary patterns - Sub-symmetries versus Papentin complexity

AU - Toussaint, Godfried

AU - Onea, Noris S.

AU - Vuong, Quan H.

PY - 2015/1/1

Y1 - 2015/1/1

N2 - This paper describes an experimental comparison of two measures of the complexity of binary patterns with respect to how well they predict human judgement of visual complexity. The experiments are performed with a data set consisting of 45 binary patterns defined on a square 6×6 array of black and white squares. The measures compared are generalizations of the measures previously explored for one-dimensional binary sequences by Alexander and Carey as well as Papentin. The former is based on counting the number of sub-symmetries present in the pattern, and the latter is an upper bound on the Kolmogorov complexity. This upper bound is obtained by calculating the shortest length of all possible descriptions of the pattern among a hierarchy of description languages.

AB - This paper describes an experimental comparison of two measures of the complexity of binary patterns with respect to how well they predict human judgement of visual complexity. The experiments are performed with a data set consisting of 45 binary patterns defined on a square 6×6 array of black and white squares. The measures compared are generalizations of the measures previously explored for one-dimensional binary sequences by Alexander and Carey as well as Papentin. The former is based on counting the number of sub-symmetries present in the pattern, and the latter is an upper bound on the Kolmogorov complexity. This upper bound is obtained by calculating the shortest length of all possible descriptions of the pattern among a hierarchy of description languages.

UR - http://www.scopus.com/inward/record.url?scp=84941255031&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84941255031&partnerID=8YFLogxK

U2 - 10.1109/MVA.2015.7153235

DO - 10.1109/MVA.2015.7153235

M3 - Conference contribution

AN - SCOPUS:84941255031

SP - 480

EP - 483

BT - Proceedings of the 14th IAPR International Conference on Machine Vision Applications, MVA 2015

PB - Institute of Electrical and Electronics Engineers Inc.

ER -