Measuring the complexity of two-dimensional binary patterns - Sub-symmetries versus Papentin complexity

Godfried Toussaint, Noris S. Onea, Quan H. Vuong

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This paper describes an experimental comparison of two measures of the complexity of binary patterns with respect to how well they predict human judgement of visual complexity. The experiments are performed with a data set consisting of 45 binary patterns defined on a square 6×6 array of black and white squares. The measures compared are generalizations of the measures previously explored for one-dimensional binary sequences by Alexander and Carey as well as Papentin. The former is based on counting the number of sub-symmetries present in the pattern, and the latter is an upper bound on the Kolmogorov complexity. This upper bound is obtained by calculating the shortest length of all possible descriptions of the pattern among a hierarchy of description languages.

Original languageEnglish (US)
Title of host publicationProceedings of the 14th IAPR International Conference on Machine Vision Applications, MVA 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages480-483
Number of pages4
ISBN (Electronic)9784901122153
DOIs
StatePublished - Jan 1 2015
Event14th IAPR International Conference on Machine Vision Applications, MVA 2015 - Tokyo, Japan
Duration: May 18 2015May 22 2015

Other

Other14th IAPR International Conference on Machine Vision Applications, MVA 2015
CountryJapan
CityTokyo
Period5/18/155/22/15

Fingerprint

Binary sequences
Experiments

ASJC Scopus subject areas

  • Computer Science Applications
  • Computer Vision and Pattern Recognition

Cite this

Toussaint, G., Onea, N. S., & Vuong, Q. H. (2015). Measuring the complexity of two-dimensional binary patterns - Sub-symmetries versus Papentin complexity. In Proceedings of the 14th IAPR International Conference on Machine Vision Applications, MVA 2015 (pp. 480-483). [7153235] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/MVA.2015.7153235

Measuring the complexity of two-dimensional binary patterns - Sub-symmetries versus Papentin complexity. / Toussaint, Godfried; Onea, Noris S.; Vuong, Quan H.

Proceedings of the 14th IAPR International Conference on Machine Vision Applications, MVA 2015. Institute of Electrical and Electronics Engineers Inc., 2015. p. 480-483 7153235.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Toussaint, G, Onea, NS & Vuong, QH 2015, Measuring the complexity of two-dimensional binary patterns - Sub-symmetries versus Papentin complexity. in Proceedings of the 14th IAPR International Conference on Machine Vision Applications, MVA 2015., 7153235, Institute of Electrical and Electronics Engineers Inc., pp. 480-483, 14th IAPR International Conference on Machine Vision Applications, MVA 2015, Tokyo, Japan, 5/18/15. https://doi.org/10.1109/MVA.2015.7153235
Toussaint G, Onea NS, Vuong QH. Measuring the complexity of two-dimensional binary patterns - Sub-symmetries versus Papentin complexity. In Proceedings of the 14th IAPR International Conference on Machine Vision Applications, MVA 2015. Institute of Electrical and Electronics Engineers Inc. 2015. p. 480-483. 7153235 https://doi.org/10.1109/MVA.2015.7153235
Toussaint, Godfried ; Onea, Noris S. ; Vuong, Quan H. / Measuring the complexity of two-dimensional binary patterns - Sub-symmetries versus Papentin complexity. Proceedings of the 14th IAPR International Conference on Machine Vision Applications, MVA 2015. Institute of Electrical and Electronics Engineers Inc., 2015. pp. 480-483
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