Measurement of the spectral line shapes for orbital excitations in the Mott insulator CoO using high-resolution resonant inelastic x-ray scattering

L. Andrew Wray, J. Li, Z. Q. Qiu, Jinsheng Wen, Zhijun Xu, Genda Gu, Shih Wen Huang, Elke Arenholz, Wanli Yang, Zahid Hussain, Yi De Chuang

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    Abstract

    We establish the spectral line shape of orbital excitations created by resonant inelastic x-ray scattering for the model Mott insulator CoO. Improved experimental energy resolution reveals that the line shapes are strikingly different from expectations in a first-principles-based atomic multiplet model. Extended theoretical simulations are performed to identify the underlying physical origins, which include a pronounced thermal tail reminiscent of anti-Stokes scattering on the energy gain side of excitations, and an essential contribution from interatomic many-body dynamics on the energy loss side of excitations.

    Original languageEnglish (US)
    Article number035105
    JournalPhysical Review B - Condensed Matter and Materials Physics
    Volume88
    Issue number3
    DOIs
    StatePublished - Jul 8 2013

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    ASJC Scopus subject areas

    • Electronic, Optical and Magnetic Materials
    • Condensed Matter Physics

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