Low cost scan test by test correlation utilization

Ozgur Sinanoglu

    Research output: Contribution to journalArticle

    Abstract

    Scan-based testing methodologies remedy the testability problem of sequential circuits; yet they suffer from prolonged test time and excessive test power due to numerous shift operations. The correlation among test data along with the high density of the unspecified bits in test data enables the utilization of the existing test data in the scan chain for the generation of the subsequent test stimulus, thus reducing both test time and test data volume. We propose a pair of scan approaches in this paper; in the first approach, a test stimulus partially consists of the preceding stimulus, while in the second approach, a test stimulus partially consists of the preceding test response bits. Both proposed scan-based test schemes access only a subset of scan cells for loading the subsequent test stimulus while freezing the remaining scan cells with the preceding test data, thus decreasing scan chain transitions during shift operations. The proposed scan architecture is coupled with test data manipulation techniques which include test stimuli ordering and partitioning algorithms, boosting test time reductions. The experimental results confirm that test time reductions exceeding 97%, and test power reductions exceeding 99% can be achieved by the proposed scan-based testing methodologies on larger ISCAS89 benchmark circuits.

    Original languageEnglish (US)
    Pages (from-to)681-694
    Number of pages14
    JournalJournal of Computer Science and Technology
    Volume22
    Issue number5
    DOIs
    StatePublished - Sep 1 2007

    Fingerprint

    Costs
    Sequential circuits
    Testing
    Freezing
    Networks (circuits)
    Methodology
    Cell
    Boosting
    Manipulation
    Partitioning
    Benchmark
    Subset
    Experimental Results

    Keywords

    • Scan architecture design
    • Scan-based testing
    • Test correlation
    • Test data compression

    ASJC Scopus subject areas

    • Hardware and Architecture
    • Computer Graphics and Computer-Aided Design
    • Software

    Cite this

    Low cost scan test by test correlation utilization. / Sinanoglu, Ozgur.

    In: Journal of Computer Science and Technology, Vol. 22, No. 5, 01.09.2007, p. 681-694.

    Research output: Contribution to journalArticle

    Sinanoglu, Ozgur. / Low cost scan test by test correlation utilization. In: Journal of Computer Science and Technology. 2007 ; Vol. 22, No. 5. pp. 681-694.
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