Longitudinal and transverse magnetization components in thin films: A resonant magnetic reflectivity investigation using circularly polarized soft x-rays

J. S. Lee, E. Vescovo, D. A. Arena, C. C. Kao, J. M. Beaujour, A. D. Kent, H. Jang, J. H. Park, J. Y. Kim

    Research output: Contribution to journalArticle

    Abstract

    An in-plane vectorial analysis of the magnetization of thin magnetic films is presented. Longitudinal soft x-ray resonant magnetic reflectivity curves display characteristic nodes where the longitudinal scattering component is suppressed by x-ray interference. The transverse magnetic component can be effectively retrieved at these nodal points, despite the use of circular polarization and longitudinal scattering geometry. Using a single geometric configuration, transverse and longitudinal magnetic hysteresis loops can be clearly separated. Calculations based on a Stoner-Wohlfarth model satisfactorily describe both loops. Therefore, this method presents a viable alternative to standard vectorial analysis techniques, with the additional benefit of element specificity.

    Original languageEnglish (US)
    Article number042507
    JournalApplied Physics Letters
    Volume96
    Issue number4
    DOIs
    StatePublished - 2010

    Fingerprint

    reflectance
    magnetization
    magnetic films
    circular polarization
    thin films
    scattering
    x rays
    hysteresis
    rocks
    interference
    curves
    geometry
    configurations

    ASJC Scopus subject areas

    • Physics and Astronomy (miscellaneous)

    Cite this

    Longitudinal and transverse magnetization components in thin films : A resonant magnetic reflectivity investigation using circularly polarized soft x-rays. / Lee, J. S.; Vescovo, E.; Arena, D. A.; Kao, C. C.; Beaujour, J. M.; Kent, A. D.; Jang, H.; Park, J. H.; Kim, J. Y.

    In: Applied Physics Letters, Vol. 96, No. 4, 042507, 2010.

    Research output: Contribution to journalArticle

    Lee, J. S. ; Vescovo, E. ; Arena, D. A. ; Kao, C. C. ; Beaujour, J. M. ; Kent, A. D. ; Jang, H. ; Park, J. H. ; Kim, J. Y. / Longitudinal and transverse magnetization components in thin films : A resonant magnetic reflectivity investigation using circularly polarized soft x-rays. In: Applied Physics Letters. 2010 ; Vol. 96, No. 4.
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    AU - Vescovo, E.

    AU - Arena, D. A.

    AU - Kao, C. C.

    AU - Beaujour, J. M.

    AU - Kent, A. D.

    AU - Jang, H.

    AU - Park, J. H.

    AU - Kim, J. Y.

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