Josephson tunneling in Bi2Sr2CaCu2O8+δ single-crystal break junctions

H. J. Tao, Farun Lu, G. Zhang, E. L. Wolf

Research output: Contribution to journalArticle

Abstract

Josephson tunneling I-V characteristics have been observed in break junctions of oxygen-annealed Bi2Sr2CaCu2O8 (Bi-2212) single crystals, with IcRn≈21.3 mV, and with a sharp quasiparticle edge at 2Δ≈2×20 mV. This demonstrates that low values of the IcRn product, thus far as observed in HTS thin-film junctions, do not represent a fundamental limitation. The sharp quasi-particle current rise at eV=2Δ in these SIS break junctions appears to afford an accurate measurement to be made of a well-defined gap edge.

Original languageEnglish (US)
Pages (from-to)117-120
Number of pages4
JournalPhysica C: Superconductivity and its Applications
Volume224
Issue number1-2
DOIs
StatePublished - Apr 20 1994

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Josephson effect
Single crystals
Oxygen
Thin films
single crystals
elementary excitations
oxygen
products
thin films

ASJC Scopus subject areas

  • Condensed Matter Physics

Cite this

Josephson tunneling in Bi2Sr2CaCu2O8+δ single-crystal break junctions. / Tao, H. J.; Lu, Farun; Zhang, G.; Wolf, E. L.

In: Physica C: Superconductivity and its Applications, Vol. 224, No. 1-2, 20.04.1994, p. 117-120.

Research output: Contribution to journalArticle

Tao, H. J. ; Lu, Farun ; Zhang, G. ; Wolf, E. L. / Josephson tunneling in Bi2Sr2CaCu2O8+δ single-crystal break junctions. In: Physica C: Superconductivity and its Applications. 1994 ; Vol. 224, No. 1-2. pp. 117-120.
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