Issues in developing a parametrized VHDL library for on-line testing

Ramesh Karri, C. Stroud, M Ding

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish (US)
Title of host publicationProceedings of Lucent Conference on Electronic Testing. April 1998. Princeton, NJ
Pages479-488
StatePublished - 1998

Cite this

Karri, R., Stroud, C., & Ding, M. (1998). Issues in developing a parametrized VHDL library for on-line testing. In Proceedings of Lucent Conference on Electronic Testing. April 1998. Princeton, NJ (pp. 479-488)

Issues in developing a parametrized VHDL library for on-line testing. / Karri, Ramesh; Stroud, C.; Ding, M.

Proceedings of Lucent Conference on Electronic Testing. April 1998. Princeton, NJ. 1998. p. 479-488.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Karri, R, Stroud, C & Ding, M 1998, Issues in developing a parametrized VHDL library for on-line testing. in Proceedings of Lucent Conference on Electronic Testing. April 1998. Princeton, NJ. pp. 479-488.
Karri R, Stroud C, Ding M. Issues in developing a parametrized VHDL library for on-line testing. In Proceedings of Lucent Conference on Electronic Testing. April 1998. Princeton, NJ. 1998. p. 479-488
Karri, Ramesh ; Stroud, C. ; Ding, M. / Issues in developing a parametrized VHDL library for on-line testing. Proceedings of Lucent Conference on Electronic Testing. April 1998. Princeton, NJ. 1998. pp. 479-488
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