Investigating the limits of AVF analysis in the presence of multiple bit errors

Mihalis Maniatakos, Maria K. Michael, Yiorgos Makris

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Abstract

    We investigate the complexity and utility of performing Multiple Bit Upset (MBU) vulnerability analysis in modern microprocessors. While the Single Bit Flip (SBF) model constitutes the prevailing mechanism for capturing the effect of Single Event Upsets (SEUs) due to alpha particle or neutron strikes in semiconductors, recent radiation studies in 90nm and 65nm technology nodes demonstrate that up to 55% of such strikes result in Multiple Bit Upsets (MBUs). Consequently, the accuracy of popular vulnerability analysis methods, such as the Architecural Vulnerability Factor (AVF) and Failures In Time (FIT) rate estimates based on the SBF assumption comes into question, especially in modern microprocessors which contain a significant amount of memory elements. Towards alleviating this concern, we present an extensive infrastructure which enables MBU vulnerability analysis in modern microprocessors. Using this infrastructure and a modern microprocessor model, we perform a large scale MBU vulnerability analysis study and we report two key findings: (i) the SBF fault model overestimates vulnerability by up to 71%, as compared to a more realistic modeling and distribution of faults in the 90nm and 65nm processes, and (ii) the rank-ordered lists of critical bits, as computed through the SBF and MBU models, respectively, are very similar, as indicated by the average rank difference of a bit which is less than 1.45%.

    Original languageEnglish (US)
    Title of host publicationProceedings of the 2013 IEEE 19th International On-Line Testing Symposium, IOLTS 2013
    Pages49-54
    Number of pages6
    DOIs
    StatePublished - Oct 15 2013
    Event2013 IEEE 19th International On-Line Testing Symposium, IOLTS 2013 - Chania, Crete, Greece
    Duration: Jul 8 2013Jul 10 2013

    Other

    Other2013 IEEE 19th International On-Line Testing Symposium, IOLTS 2013
    CountryGreece
    CityChania, Crete
    Period7/8/137/10/13

    Fingerprint

    Factor analysis
    Microprocessor chips
    Alpha particles
    Neutrons
    Semiconductor materials
    Radiation
    Data storage equipment

    ASJC Scopus subject areas

    • Safety, Risk, Reliability and Quality

    Cite this

    Maniatakos, M., Michael, M. K., & Makris, Y. (2013). Investigating the limits of AVF analysis in the presence of multiple bit errors. In Proceedings of the 2013 IEEE 19th International On-Line Testing Symposium, IOLTS 2013 (pp. 49-54). [6604050] https://doi.org/10.1109/IOLTS.2013.6604050

    Investigating the limits of AVF analysis in the presence of multiple bit errors. / Maniatakos, Mihalis; Michael, Maria K.; Makris, Yiorgos.

    Proceedings of the 2013 IEEE 19th International On-Line Testing Symposium, IOLTS 2013. 2013. p. 49-54 6604050.

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Maniatakos, M, Michael, MK & Makris, Y 2013, Investigating the limits of AVF analysis in the presence of multiple bit errors. in Proceedings of the 2013 IEEE 19th International On-Line Testing Symposium, IOLTS 2013., 6604050, pp. 49-54, 2013 IEEE 19th International On-Line Testing Symposium, IOLTS 2013, Chania, Crete, Greece, 7/8/13. https://doi.org/10.1109/IOLTS.2013.6604050
    Maniatakos M, Michael MK, Makris Y. Investigating the limits of AVF analysis in the presence of multiple bit errors. In Proceedings of the 2013 IEEE 19th International On-Line Testing Symposium, IOLTS 2013. 2013. p. 49-54. 6604050 https://doi.org/10.1109/IOLTS.2013.6604050
    Maniatakos, Mihalis ; Michael, Maria K. ; Makris, Yiorgos. / Investigating the limits of AVF analysis in the presence of multiple bit errors. Proceedings of the 2013 IEEE 19th International On-Line Testing Symposium, IOLTS 2013. 2013. pp. 49-54
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