Invariance-based concurrent error detection for advanced encryption standard

Xiaofei Guo, Ramesh Karri

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Naturally occurring and maliciously injected faults reduce the reliability of Advanced Encryption Standard (AES) and may leak confidential information. We developed an invariance-based concurrent error detection (CED) scheme which is independent of the implementation of AES encryption/decryption. Additionally, we improve the security of our scheme with Randomized CED Round Insertion and adaptive checking. Experimental results show that the invariance-based CED scheme detects all single-bit, all single-byte fault, and 99.99999997% of burst faults. The area and delay overheads of this scheme are compared with those of previously reported CED schemes on two Xilinx Virtex FPGAs. The hardware overhead is in the 13.2-27.3% range and the throughput is between 1.8-42.2Gbps depending on the AES architecture, FPGA family, and the detection latency. One can implement our scheme in many ways; designers can trade off performance, reliability, and security according to the available resources.

Original languageEnglish (US)
Title of host publicationProceedings of the 49th Annual Design Automation Conference, DAC '12
Pages573-578
Number of pages6
DOIs
StatePublished - 2012
Event49th Annual Design Automation Conference, DAC '12 - San Francisco, CA, United States
Duration: Jun 3 2012Jun 7 2012

Other

Other49th Annual Design Automation Conference, DAC '12
CountryUnited States
CitySan Francisco, CA
Period6/3/126/7/12

Fingerprint

Advanced Encryption Standard
Error Detection
Error detection
Invariance
Cryptography
Concurrent
Field programmable gate arrays (FPGA)
Fault
Field Programmable Gate Array
Throughput
Burst
Hardware
Encryption
Insertion
Latency
Trade-offs
Resources
Experimental Results
Range of data

Keywords

  • concurrent error detection
  • fault injection attack
  • reliability

ASJC Scopus subject areas

  • Computer Science Applications
  • Control and Systems Engineering
  • Electrical and Electronic Engineering
  • Modeling and Simulation

Cite this

Guo, X., & Karri, R. (2012). Invariance-based concurrent error detection for advanced encryption standard. In Proceedings of the 49th Annual Design Automation Conference, DAC '12 (pp. 573-578) https://doi.org/10.1145/2228360.2228463

Invariance-based concurrent error detection for advanced encryption standard. / Guo, Xiaofei; Karri, Ramesh.

Proceedings of the 49th Annual Design Automation Conference, DAC '12. 2012. p. 573-578.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Guo, X & Karri, R 2012, Invariance-based concurrent error detection for advanced encryption standard. in Proceedings of the 49th Annual Design Automation Conference, DAC '12. pp. 573-578, 49th Annual Design Automation Conference, DAC '12, San Francisco, CA, United States, 6/3/12. https://doi.org/10.1145/2228360.2228463
Guo X, Karri R. Invariance-based concurrent error detection for advanced encryption standard. In Proceedings of the 49th Annual Design Automation Conference, DAC '12. 2012. p. 573-578 https://doi.org/10.1145/2228360.2228463
Guo, Xiaofei ; Karri, Ramesh. / Invariance-based concurrent error detection for advanced encryption standard. Proceedings of the 49th Annual Design Automation Conference, DAC '12. 2012. pp. 573-578
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