In situ microwave reflection coefficient measurements for the rough exterior wall surfaces

Orlando Landron, Martin Feuerstein, Theodore Rappaport

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Microwave reflection coefficient measurements at 1.9 GHz and 4.0 GHz are given for a variety of typical smooth and rough exterior building surfaces. The measurements are compared to theoretical Fresnel reflection coefficients using Gaussian rough surface scattering models when applicable. Individual multipaths are resolved temporally using a spread spectrum sliding correlation system, and spatially using directional antennas. The measurement test cases included walls made of limestone blocks, glass, and brick. The results indicate that the Fresnel reflection coefficients adequately describe the reflective properties for the glass and brick surfaces. The rough stone wall measurements are shown to be bounded by predictions for a smooth surface model and a Gaussian rough surface model. The results of this work can be used to estimate reflection coefficients in ray tracing algorithms for propagation prediction.

Original languageEnglish (US)
Title of host publicationIEEE Vehicular Technology Conference
PublisherPubl by IEEE
Pages77-80
Number of pages4
ISBN (Print)078031266X
StatePublished - 1993
EventProceedings of the 43rd IEEE Vehicular Technology Conference - Secaucus, NJ, USA
Duration: May 18 1993May 20 1993

Other

OtherProceedings of the 43rd IEEE Vehicular Technology Conference
CitySecaucus, NJ, USA
Period5/18/935/20/93

Fingerprint

Microwaves
Brick
Surface scattering
Glass
Ray tracing
Limestone
Antennas

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Landron, O., Feuerstein, M., & Rappaport, T. (1993). In situ microwave reflection coefficient measurements for the rough exterior wall surfaces. In IEEE Vehicular Technology Conference (pp. 77-80). Publ by IEEE.

In situ microwave reflection coefficient measurements for the rough exterior wall surfaces. / Landron, Orlando; Feuerstein, Martin; Rappaport, Theodore.

IEEE Vehicular Technology Conference. Publ by IEEE, 1993. p. 77-80.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Landron, O, Feuerstein, M & Rappaport, T 1993, In situ microwave reflection coefficient measurements for the rough exterior wall surfaces. in IEEE Vehicular Technology Conference. Publ by IEEE, pp. 77-80, Proceedings of the 43rd IEEE Vehicular Technology Conference, Secaucus, NJ, USA, 5/18/93.
Landron O, Feuerstein M, Rappaport T. In situ microwave reflection coefficient measurements for the rough exterior wall surfaces. In IEEE Vehicular Technology Conference. Publ by IEEE. 1993. p. 77-80
Landron, Orlando ; Feuerstein, Martin ; Rappaport, Theodore. / In situ microwave reflection coefficient measurements for the rough exterior wall surfaces. IEEE Vehicular Technology Conference. Publ by IEEE, 1993. pp. 77-80
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