Improving inventory round times in EPC gen2 RFID by utilizing doubly collided slots

Benjamin Bekritsky, Peter Voltz

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish (US)
Title of host publicationInternational Conference on Cutting Edge Wireless and IT Technologies (CEWIT'07), Stony Brook, NY, January 18, 2007
StatePublished - 2007

Cite this

Bekritsky, B., & Voltz, P. (2007). Improving inventory round times in EPC gen2 RFID by utilizing doubly collided slots. In International Conference on Cutting Edge Wireless and IT Technologies (CEWIT'07), Stony Brook, NY, January 18, 2007

Improving inventory round times in EPC gen2 RFID by utilizing doubly collided slots. / Bekritsky, Benjamin; Voltz, Peter.

International Conference on Cutting Edge Wireless and IT Technologies (CEWIT'07), Stony Brook, NY, January 18, 2007. 2007.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Bekritsky, B & Voltz, P 2007, Improving inventory round times in EPC gen2 RFID by utilizing doubly collided slots. in International Conference on Cutting Edge Wireless and IT Technologies (CEWIT'07), Stony Brook, NY, January 18, 2007.
Bekritsky B, Voltz P. Improving inventory round times in EPC gen2 RFID by utilizing doubly collided slots. In International Conference on Cutting Edge Wireless and IT Technologies (CEWIT'07), Stony Brook, NY, January 18, 2007. 2007
Bekritsky, Benjamin ; Voltz, Peter. / Improving inventory round times in EPC gen2 RFID by utilizing doubly collided slots. International Conference on Cutting Edge Wireless and IT Technologies (CEWIT'07), Stony Brook, NY, January 18, 2007. 2007.
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