Image steganalysis with binary similarity measures

Ismail Avcibas, Nasir Memon, Bülent Sankur

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Abstract

    We present a novel technique for steganalysis of images that have been subjected to Least Significant Bit (LSB) type steganographic algorithms. The seventh and eight bit planes in an image are used for the computation of several binary similarity measures. The basic idea is that, the correlation between the bit planes as well the binary texture characteristics within the bit planes will differ between a stego-image and a cover-image. These telltale marks can be used to construct a steganalyzer, that is, a multivariate regression scheme to detect the presence of a steganographic message in an image.

    Original languageEnglish (US)
    Title of host publicationIEEE International Conference on Image Processing
    Volume3
    StatePublished - 2002
    EventInternational Conference on Image Processing (ICIP'02) - Rochester, NY, United States
    Duration: Sep 22 2002Sep 25 2002

    Other

    OtherInternational Conference on Image Processing (ICIP'02)
    CountryUnited States
    CityRochester, NY
    Period9/22/029/25/02

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    ASJC Scopus subject areas

    • Computer Vision and Pattern Recognition
    • Hardware and Architecture
    • Electrical and Electronic Engineering

    Cite this

    Avcibas, I., Memon, N., & Sankur, B. (2002). Image steganalysis with binary similarity measures. In IEEE International Conference on Image Processing (Vol. 3)

    Image steganalysis with binary similarity measures. / Avcibas, Ismail; Memon, Nasir; Sankur, Bülent.

    IEEE International Conference on Image Processing. Vol. 3 2002.

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Avcibas, I, Memon, N & Sankur, B 2002, Image steganalysis with binary similarity measures. in IEEE International Conference on Image Processing. vol. 3, International Conference on Image Processing (ICIP'02), Rochester, NY, United States, 9/22/02.
    Avcibas I, Memon N, Sankur B. Image steganalysis with binary similarity measures. In IEEE International Conference on Image Processing. Vol. 3. 2002
    Avcibas, Ismail ; Memon, Nasir ; Sankur, Bülent. / Image steganalysis with binary similarity measures. IEEE International Conference on Image Processing. Vol. 3 2002.
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