High resolution multiple electron impact ionisation of He, Ne, Ar, Kr and Xe atoms close to threshold: Appearance energies and Wannier exponents

B. Gstir, S. Denifl, G. Hanel, M. Rümmele, T. Fiegele, M. Stano, L. Feketeova, S. Matejcik, K. Becker, P. Scheier, T. D. Märk

Research output: Contribution to journalArticle

Abstract

We have determined appearance energies AE(Xn+/X) for the formation of multiply charged He, Ne, Ar, Kr and Xe ions up to charge state n = 2 (He), n = 4 (Ne), n = 6 (Ar), n = 6 (Kr) and n = 8 (Xe) using a recently commissioned high-resolution electron impact ionization mass spectrometer. The data analysis is based on the Marquart-Levenberg algorithm, involving an iterative, non-linear least-squares fitting of the threshold data assuming a 2-function or a 3-function fit based on a Wannier-type power law. This allows us to extract the relevant AEs and corresponding Wannier exponents.

Original languageEnglish (US)
Pages (from-to)413-416
Number of pages4
JournalNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Volume205
DOIs
StatePublished - May 2003

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Impact ionization
electron impact
exponents
ionization
Atoms
thresholds
Electrons
high resolution
Mass spectrometers
mass spectrometers
atoms
Ions
energy
ions

Keywords

  • Electron impact ionization
  • Hemispherical electron monochromator
  • Ionization energy
  • Rare gases
  • Threshold law
  • Wannier exponent

ASJC Scopus subject areas

  • Surfaces, Coatings and Films
  • Instrumentation
  • Surfaces and Interfaces

Cite this

High resolution multiple electron impact ionisation of He, Ne, Ar, Kr and Xe atoms close to threshold : Appearance energies and Wannier exponents. / Gstir, B.; Denifl, S.; Hanel, G.; Rümmele, M.; Fiegele, T.; Stano, M.; Feketeova, L.; Matejcik, S.; Becker, K.; Scheier, P.; Märk, T. D.

In: Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, Vol. 205, 05.2003, p. 413-416.

Research output: Contribution to journalArticle

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T1 - High resolution multiple electron impact ionisation of He, Ne, Ar, Kr and Xe atoms close to threshold

T2 - Appearance energies and Wannier exponents

AU - Gstir, B.

AU - Denifl, S.

AU - Hanel, G.

AU - Rümmele, M.

AU - Fiegele, T.

AU - Stano, M.

AU - Feketeova, L.

AU - Matejcik, S.

AU - Becker, K.

AU - Scheier, P.

AU - Märk, T. D.

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AB - We have determined appearance energies AE(Xn+/X) for the formation of multiply charged He, Ne, Ar, Kr and Xe ions up to charge state n = 2 (He), n = 4 (Ne), n = 6 (Ar), n = 6 (Kr) and n = 8 (Xe) using a recently commissioned high-resolution electron impact ionization mass spectrometer. The data analysis is based on the Marquart-Levenberg algorithm, involving an iterative, non-linear least-squares fitting of the threshold data assuming a 2-function or a 3-function fit based on a Wannier-type power law. This allows us to extract the relevant AEs and corresponding Wannier exponents.

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KW - Hemispherical electron monochromator

KW - Ionization energy

KW - Rare gases

KW - Threshold law

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