Guest editor's introduction to special section on high-level design validation and test

Research output: Contribution to journalArticle

Original languageEnglish (US)
Pages (from-to)353-354
Number of pages2
JournalIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Volume20
Issue number3
DOIs
StatePublished - Mar 2001

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Integrated circuit testing
Program debugging
Technical writing
Design for testability
Automatic testing
Data compression
Technical presentations
Microprocessor chips

ASJC Scopus subject areas

  • Computational Theory and Mathematics
  • Computer Science Applications
  • Hardware and Architecture
  • Electrical and Electronic Engineering

Cite this

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title = "Guest editor's introduction to special section on high-level design validation and test",
author = "R. Karri",
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