FPGA Trust Zone: Incorporating trust and reliability into FPGA designs

Vinayaka Jyothi, Manasa Thoonoli, Richard Stern, Ramesh Karri

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This paper proposes a novel methodology FPGA Trust Zone (FTZ) to incorporate security into the design cycle to detect and isolate anomalies such as Hardware Trojans in the FPGA fabric. Anomalies are identified using violation to spatial correlation of process variation in FPGA fabric. Anomalies are isolated using Xilinx Isolation Design Flow (IDF) methodology. FTZ helps identify and partition the FPGA into areas that are devoid of anomalies and thus, assists to run designs securely and reliably even in an anomaly-infected FPGA. FTZ also assists IDF to select trustworthy areas for implementing isolated designs and trusted routes. We demonstrate the effectiveness of FTZ for AES and RC5 designs on Xilinx Virtex-7 and Atrix-7 FPGAs.

Original languageEnglish (US)
Title of host publicationProceedings of the 34th IEEE International Conference on Computer Design, ICCD 2016
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages600-605
Number of pages6
ISBN (Electronic)9781509051427
DOIs
StatePublished - Nov 22 2016
Event34th IEEE International Conference on Computer Design, ICCD 2016 - Scottsdale, United States
Duration: Oct 2 2016Oct 5 2016

Other

Other34th IEEE International Conference on Computer Design, ICCD 2016
CountryUnited States
CityScottsdale
Period10/2/1610/5/16

Fingerprint

Field programmable gate arrays (FPGA)
Hardware

ASJC Scopus subject areas

  • Hardware and Architecture

Cite this

Jyothi, V., Thoonoli, M., Stern, R., & Karri, R. (2016). FPGA Trust Zone: Incorporating trust and reliability into FPGA designs. In Proceedings of the 34th IEEE International Conference on Computer Design, ICCD 2016 (pp. 600-605). [7753346] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ICCD.2016.7753346

FPGA Trust Zone : Incorporating trust and reliability into FPGA designs. / Jyothi, Vinayaka; Thoonoli, Manasa; Stern, Richard; Karri, Ramesh.

Proceedings of the 34th IEEE International Conference on Computer Design, ICCD 2016. Institute of Electrical and Electronics Engineers Inc., 2016. p. 600-605 7753346.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Jyothi, V, Thoonoli, M, Stern, R & Karri, R 2016, FPGA Trust Zone: Incorporating trust and reliability into FPGA designs. in Proceedings of the 34th IEEE International Conference on Computer Design, ICCD 2016., 7753346, Institute of Electrical and Electronics Engineers Inc., pp. 600-605, 34th IEEE International Conference on Computer Design, ICCD 2016, Scottsdale, United States, 10/2/16. https://doi.org/10.1109/ICCD.2016.7753346
Jyothi V, Thoonoli M, Stern R, Karri R. FPGA Trust Zone: Incorporating trust and reliability into FPGA designs. In Proceedings of the 34th IEEE International Conference on Computer Design, ICCD 2016. Institute of Electrical and Electronics Engineers Inc. 2016. p. 600-605. 7753346 https://doi.org/10.1109/ICCD.2016.7753346
Jyothi, Vinayaka ; Thoonoli, Manasa ; Stern, Richard ; Karri, Ramesh. / FPGA Trust Zone : Incorporating trust and reliability into FPGA designs. Proceedings of the 34th IEEE International Conference on Computer Design, ICCD 2016. Institute of Electrical and Electronics Engineers Inc., 2016. pp. 600-605
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