Fault identification in reconfigurable carry lookahead adders targeting nanoelectronic fabrics

Wenjing Rao, Alex Orailoglu, Ramesh Karri

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Online repair through reconfiguration is a particularly advantageous approach in the nanoelectronic environment since reconfigurability is naturally supported by the devices. However, precise identification of faulty locations is of critical importance for fine-grain repairs. A CLA is mainly composed of: (1) carry generation blocks and (2) g,p signal generation blocks. In this paper we propose two schemes for fault identification in these two parts correspondingly. For carry generation blocks, an inherently redundant computation path is exploited to identify the faulty block with high precision. As a time redundancy approach, recomputation with rotated operands (RERO) has been utilized in online fault detection for CLA's [13]. For g,p generation blocks, we exploit the RERO scheme to achieve precise fault identification. A comprehensive analysis is provided for the aliasing in the proposed fault identification approach. It is shown that both the amount of repair hardware overhead and the fault coverage loss for the proposed scheme are very low. Overall, the proposed scheme can perform fast and precise identification of faults in the CLA components with low area overhead, thus facilitating the development of powerful and efficient fault tolerance schemes through online repair for nanoelectronic systems.

Original languageEnglish (US)
Title of host publicationProceedings - Thirteenth International Symposium on Temporal Representation and Reasoning, TIME 2006
Pages63-68
Number of pages6
Volume2006
DOIs
StatePublished - 2006
Event11th IEEE European Test Symposium, ETS 2006 - Southampton, United Kingdom
Duration: May 21 2006May 21 2006

Other

Other11th IEEE European Test Symposium, ETS 2006
CountryUnited Kingdom
CitySouthampton
Period5/21/065/21/06

Fingerprint

Nanoelectronics
Adders
Repair
Fault tolerance
Fault detection
Redundancy
Hardware

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Rao, W., Orailoglu, A., & Karri, R. (2006). Fault identification in reconfigurable carry lookahead adders targeting nanoelectronic fabrics. In Proceedings - Thirteenth International Symposium on Temporal Representation and Reasoning, TIME 2006 (Vol. 2006, pp. 63-68). [1628155] https://doi.org/10.1109/ETS.2006.23

Fault identification in reconfigurable carry lookahead adders targeting nanoelectronic fabrics. / Rao, Wenjing; Orailoglu, Alex; Karri, Ramesh.

Proceedings - Thirteenth International Symposium on Temporal Representation and Reasoning, TIME 2006. Vol. 2006 2006. p. 63-68 1628155.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Rao, W, Orailoglu, A & Karri, R 2006, Fault identification in reconfigurable carry lookahead adders targeting nanoelectronic fabrics. in Proceedings - Thirteenth International Symposium on Temporal Representation and Reasoning, TIME 2006. vol. 2006, 1628155, pp. 63-68, 11th IEEE European Test Symposium, ETS 2006, Southampton, United Kingdom, 5/21/06. https://doi.org/10.1109/ETS.2006.23
Rao W, Orailoglu A, Karri R. Fault identification in reconfigurable carry lookahead adders targeting nanoelectronic fabrics. In Proceedings - Thirteenth International Symposium on Temporal Representation and Reasoning, TIME 2006. Vol. 2006. 2006. p. 63-68. 1628155 https://doi.org/10.1109/ETS.2006.23
Rao, Wenjing ; Orailoglu, Alex ; Karri, Ramesh. / Fault identification in reconfigurable carry lookahead adders targeting nanoelectronic fabrics. Proceedings - Thirteenth International Symposium on Temporal Representation and Reasoning, TIME 2006. Vol. 2006 2006. pp. 63-68
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