Exchange coupling in FeTaN-FeSm-FeTaN multilayers: A Kerr effect study

Gianluca Gubbiotti, Giovanni Carlotti, Marco Madami, James Weston, Paolo Vavassori, Giovanni Zangari

Research output: Contribution to journalConference article

Abstract

The dependence of the interlayer coupling on both the soft (FeTaN) and hard (FeSm) layer thickness in FeTaN-FeSm-FeTaN multilayers, deposited by dc magnetron sputtering, has been investigated. The magnetization reversal process is examined experimentally using a magnetooptical Kerr effect. The exchange field Hex, which is a measure of the average coupling between the soft and hard layers, was determined from the field shift of the minor hysteresis loop. The value of Hex increases as the number of the soft FeTaN layer increases. A significant and fully reversible transverse hysteresis loop was measured indicating that, during the magnetization-reversal process, the magnetic moments in the soft layers rotate reversibly, as typical of exchange-spring systems.

Original languageEnglish (US)
Pages (from-to)2779-2781
Number of pages3
JournalIEEE Transactions on Magnetics
Volume38
Issue number5 I
DOIs
StatePublished - Sep 1 2002
Event2002 International Magnetics Conference (Intermag 2002) - Amsterdam, Netherlands
Duration: Apr 28 2002May 2 2002

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Keywords

  • Anisotropy-growth induced
  • Coercivity
  • Exchange spring
  • Magnetooptic Kerr effect

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Physics and Astronomy (miscellaneous)

Cite this

Gubbiotti, G., Carlotti, G., Madami, M., Weston, J., Vavassori, P., & Zangari, G. (2002). Exchange coupling in FeTaN-FeSm-FeTaN multilayers: A Kerr effect study. IEEE Transactions on Magnetics, 38(5 I), 2779-2781. https://doi.org/10.1109/TMAG.2002.803238