Eliminating the timing penalty of scan

Ozgur Sinanoglu, Vishwani D. Agrawal

    Research output: Contribution to journalArticle

    Abstract

    Stringent performance requirements magnify the performance degradation impact of Design-for-Testability (DfT) techniques. As more aggressive performance optimizations are being employed, resulting in high-performance designs with reduced logic depth, the impact of scan multiplexers is becoming even more magnified. In this work, we propose a pair of scan cell transformation techniques that transfers the scan multiplexer delay from the input of the flip-flop to its output, enabling the removal of the scan multiplexer delay off the critical paths. The first technique is an ad-hoc technique, while the second one is the retiming technique applied on the scan logic. The proposed transformation techniques retain the test development (test data, quality, etc.) and application (test time, power dissipation, etc.) intact, fully complying with the conventional design and test flow. Experimental results justify the efficacy of the proposed techniques in eliminating the performance penalty of scan in a cost-effective way and thus enhancing the functional speed of integrated circuits.

    Original languageEnglish (US)
    Pages (from-to)103-114
    Number of pages12
    JournalJournal of Electronic Testing: Theory and Applications (JETTA)
    Volume29
    Issue number1
    DOIs
    StatePublished - Feb 25 2013

    Fingerprint

    Design for testability
    Flip flop circuits
    Integrated circuits
    Energy dissipation
    Degradation
    Costs

    Keywords

    • Multiplexer delay
    • Scan penalty
    • Scan retiming
    • Timing penalty

    ASJC Scopus subject areas

    • Electrical and Electronic Engineering

    Cite this

    Eliminating the timing penalty of scan. / Sinanoglu, Ozgur; Agrawal, Vishwani D.

    In: Journal of Electronic Testing: Theory and Applications (JETTA), Vol. 29, No. 1, 25.02.2013, p. 103-114.

    Research output: Contribution to journalArticle

    Sinanoglu, Ozgur ; Agrawal, Vishwani D. / Eliminating the timing penalty of scan. In: Journal of Electronic Testing: Theory and Applications (JETTA). 2013 ; Vol. 29, No. 1. pp. 103-114.
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