Electron impact multiple ionization of neon, argon and xenon atoms close to threshold: Appearance energies and Wannier exponents

B. Gstir, S. Denifl, G. Hanel, M. Rümmele, T. Fiegele, P. Cicman, M. Stano, S. Matejcik, P. Scheier, K. Becker, A. Stamatovic, T. D. Märk

Research output: Contribution to journalArticle

Abstract

We report the results of the experimental determination of the appearance energy values AE(Xn+/X) for the formation of multiply charged Ne, Ar and Xe ions up to n = 4 (Ne), n = 6(Ar) and n = 8 (Xe) following electron impact on Ne, Ar and Xe atoms using a dedicated high-resolution electron impact ionization mass spectrometer. The data analysis uses the Marquart-Levenberg algorithm, which is an iterative, nonlinear least-squares-fitting routine, in conjunction with either a two-function or a three-function fit based on a power threshold law. This allows us to extract the relevant AEs and corresponding exponents for a Wannier-type power law from the measured near-threshold data. The values of the AEs determined in this work are compared with other available experimental and spectroscopic values of the AEs and the extracted exponents are compared with other available experimental data and with the predictions of the various Wannier-type power law models.

Original languageEnglish (US)
Pages (from-to)2993-3007
Number of pages15
JournalJournal of Physics B: Atomic, Molecular and Optical Physics
Volume35
Issue number13
DOIs
StatePublished - Jul 14 2002

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neon
xenon
electron impact
argon
exponents
ionization
thresholds
atoms
mass spectrometers
energy
high resolution
predictions
ions

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • Physics and Astronomy(all)

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Electron impact multiple ionization of neon, argon and xenon atoms close to threshold : Appearance energies and Wannier exponents. / Gstir, B.; Denifl, S.; Hanel, G.; Rümmele, M.; Fiegele, T.; Cicman, P.; Stano, M.; Matejcik, S.; Scheier, P.; Becker, K.; Stamatovic, A.; Märk, T. D.

In: Journal of Physics B: Atomic, Molecular and Optical Physics, Vol. 35, No. 13, 14.07.2002, p. 2993-3007.

Research output: Contribution to journalArticle

Gstir, B, Denifl, S, Hanel, G, Rümmele, M, Fiegele, T, Cicman, P, Stano, M, Matejcik, S, Scheier, P, Becker, K, Stamatovic, A & Märk, TD 2002, 'Electron impact multiple ionization of neon, argon and xenon atoms close to threshold: Appearance energies and Wannier exponents', Journal of Physics B: Atomic, Molecular and Optical Physics, vol. 35, no. 13, pp. 2993-3007. https://doi.org/10.1088/0953-4075/35/13/312
Gstir, B. ; Denifl, S. ; Hanel, G. ; Rümmele, M. ; Fiegele, T. ; Cicman, P. ; Stano, M. ; Matejcik, S. ; Scheier, P. ; Becker, K. ; Stamatovic, A. ; Märk, T. D. / Electron impact multiple ionization of neon, argon and xenon atoms close to threshold : Appearance energies and Wannier exponents. In: Journal of Physics B: Atomic, Molecular and Optical Physics. 2002 ; Vol. 35, No. 13. pp. 2993-3007.
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AU - Stano, M.

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