Electron-impact ionization of silicon-organic molecules

R. Basner, R. Foest, M. Schmidt, Kurt Becker

Research output: Contribution to journalArticle

Original languageEnglish (US)
Pages (from-to)1-10
JournalAdvances in Mass Spectrometry
Volume14
StatePublished - 1999

Cite this

Electron-impact ionization of silicon-organic molecules. / Basner, R.; Foest, R.; Schmidt, M.; Becker, Kurt.

In: Advances in Mass Spectrometry, Vol. 14, 1999, p. 1-10.

Research output: Contribution to journalArticle

Basner, R. ; Foest, R. ; Schmidt, M. ; Becker, Kurt. / Electron-impact ionization of silicon-organic molecules. In: Advances in Mass Spectrometry. 1999 ; Vol. 14. pp. 1-10.
@article{4c34e8fac0cc455aa13b307ebb900fe4,
title = "Electron-impact ionization of silicon-organic molecules",
author = "R. Basner and R. Foest and M. Schmidt and Kurt Becker",
year = "1999",
language = "English (US)",
volume = "14",
pages = "1--10",
journal = "Advances in Mass Spectrometry",

}

TY - JOUR

T1 - Electron-impact ionization of silicon-organic molecules

AU - Basner, R.

AU - Foest, R.

AU - Schmidt, M.

AU - Becker, Kurt

PY - 1999

Y1 - 1999

M3 - Article

VL - 14

SP - 1

EP - 10

JO - Advances in Mass Spectrometry

JF - Advances in Mass Spectrometry

ER -