Electron impact induced dissociative excitation and ionization of halogen-containing molecules

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish (US)
Title of host publicationInvited Papers of the 9th International Symposium on Electron Collisions with Molecules, Clusters and Surfaces
EditorsL.A. Morgan, H. Ehrhardt
Place of PublicationNew York
PublisherPlenum Press
Pages127-140
StatePublished - 1994

Cite this

Becker, K. (1994). Electron impact induced dissociative excitation and ionization of halogen-containing molecules. In L. A. Morgan, & H. Ehrhardt (Eds.), Invited Papers of the 9th International Symposium on Electron Collisions with Molecules, Clusters and Surfaces (pp. 127-140). New York: Plenum Press.

Electron impact induced dissociative excitation and ionization of halogen-containing molecules. / Becker, Kurt.

Invited Papers of the 9th International Symposium on Electron Collisions with Molecules, Clusters and Surfaces. ed. / L.A. Morgan; H. Ehrhardt. New York : Plenum Press, 1994. p. 127-140.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Becker, K 1994, Electron impact induced dissociative excitation and ionization of halogen-containing molecules. in LA Morgan & H Ehrhardt (eds), Invited Papers of the 9th International Symposium on Electron Collisions with Molecules, Clusters and Surfaces. Plenum Press, New York, pp. 127-140.
Becker K. Electron impact induced dissociative excitation and ionization of halogen-containing molecules. In Morgan LA, Ehrhardt H, editors, Invited Papers of the 9th International Symposium on Electron Collisions with Molecules, Clusters and Surfaces. New York: Plenum Press. 1994. p. 127-140
Becker, Kurt. / Electron impact induced dissociative excitation and ionization of halogen-containing molecules. Invited Papers of the 9th International Symposium on Electron Collisions with Molecules, Clusters and Surfaces. editor / L.A. Morgan ; H. Ehrhardt. New York : Plenum Press, 1994. pp. 127-140
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