Electrical characterization of silicon nanocrystal films

Neema Rastgar, Dave Rowe, Lance M. Wheeler, Eray Aydil, Uwe Kortshagen

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish (US)
Title of host publicationMaterials Engineering and Sciences Division - Core Programming Topic at the 2011 AIChE Annual Meeting
PublisherAIChE
Pages154-155
Number of pages2
Volume1
ISBN (Print)9781618397294
StatePublished - Jan 1 2011
EventMaterials Engineering and Sciences Division - Core Programming Topic at the 2011 AIChE Annual Meeting - Minneapolis, United States
Duration: Oct 16 2011Oct 21 2016

Other

OtherMaterials Engineering and Sciences Division - Core Programming Topic at the 2011 AIChE Annual Meeting
CountryUnited States
CityMinneapolis
Period10/16/1110/21/16

ASJC Scopus subject areas

  • Chemical Health and Safety
  • Safety, Risk, Reliability and Quality
  • Safety Research

Cite this

Rastgar, N., Rowe, D., Wheeler, L. M., Aydil, E., & Kortshagen, U. (2011). Electrical characterization of silicon nanocrystal films. In Materials Engineering and Sciences Division - Core Programming Topic at the 2011 AIChE Annual Meeting (Vol. 1, pp. 154-155). AIChE.