Efficient RT-level fault diagnosis

Ozgur Sinanoglu, Alex Orailoglu

Research output: Contribution to journalArticle

Abstract

Increasing IC densities necessitate diagnosis methodologies with enhanced defect locating capabilities. Yet the computational effort expended in extracting diagnostic information and the stringent storage requirements constitute major concerns due to the tremendous number of faults in typical ICs. In this paper, we propose an RT-level diagnosis methodology capable of responding to these challenges. In the proposed scheme, diagnostic information is computed on a grouped fault effect basis, enhancing both the storage and the computational aspects. The fault effect grouping criteria are identified based on a module structure analysis, improving the propagation ability of the diagnostic information through RT modules. Experimental results show that the proposed methodology provides superior speed-ups and significant diagnostic information compression at no sacrifice in diagnostic resolution, compared to the existing gate-level diagnosis approaches.

Original languageEnglish (US)
Pages (from-to)166-174
Number of pages9
JournalJournal of Computer Science and Technology
Volume20
Issue number2
DOIs
StatePublished - Mar 1 2005

Fingerprint

Fault Diagnosis
Failure analysis
Diagnostics
Fault
Methodology
Module
Defects
Grouping
Compression
Propagation
Requirements
Experimental Results

Keywords

  • Dictionary compaction
  • Fault bit location tracing
  • Fault diagnosis
  • Fault dictionary
  • Fault simulation
  • RT-level diagnosis

ASJC Scopus subject areas

  • Computer Graphics and Computer-Aided Design
  • Hardware and Architecture
  • Software

Cite this

Efficient RT-level fault diagnosis. / Sinanoglu, Ozgur; Orailoglu, Alex.

In: Journal of Computer Science and Technology, Vol. 20, No. 2, 01.03.2005, p. 166-174.

Research output: Contribution to journalArticle

Sinanoglu, Ozgur ; Orailoglu, Alex. / Efficient RT-level fault diagnosis. In: Journal of Computer Science and Technology. 2005 ; Vol. 20, No. 2. pp. 166-174.
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