Efficient RT-level fault diagnosis

Ozgur Sinanoglu, Alex Orailoglu

    Research output: Contribution to journalArticle

    Abstract

    Increasing IC densities necessitate diagnosis methodologies with enhanced defect locating capabilities. Yet the computational effort expended in extracting diagnostic information and the stringent storage requirements constitute major concerns due to the tremendous number of faults in typical ICs. In this paper, we propose an RT-level diagnosis methodology capable of responding to these challenges. In the proposed scheme, diagnostic information is computed on a grouped fault effect basis, enhancing both the storage and the computational aspects. The fault effect grouping criteria are identified based on a module structure analysis, improving the propagation ability of the diagnostic information through RT modules. Experimental results show that the proposed methodology provides superior speed-ups and significant diagnostic information compression at no sacrifice in diagnostic resolution, compared to the existing gate-level diagnosis approaches.

    Original languageEnglish (US)
    Pages (from-to)166-174
    Number of pages9
    JournalJournal of Computer Science and Technology
    Volume20
    Issue number2
    DOIs
    StatePublished - Mar 1 2005

    Fingerprint

    Fault Diagnosis
    Failure analysis
    Diagnostics
    Fault
    Methodology
    Module
    Defects
    Grouping
    Compression
    Propagation
    Requirements
    Experimental Results

    Keywords

    • Dictionary compaction
    • Fault bit location tracing
    • Fault diagnosis
    • Fault dictionary
    • Fault simulation
    • RT-level diagnosis

    ASJC Scopus subject areas

    • Computer Graphics and Computer-Aided Design
    • Hardware and Architecture
    • Software

    Cite this

    Efficient RT-level fault diagnosis. / Sinanoglu, Ozgur; Orailoglu, Alex.

    In: Journal of Computer Science and Technology, Vol. 20, No. 2, 01.03.2005, p. 166-174.

    Research output: Contribution to journalArticle

    Sinanoglu, Ozgur ; Orailoglu, Alex. / Efficient RT-level fault diagnosis. In: Journal of Computer Science and Technology. 2005 ; Vol. 20, No. 2. pp. 166-174.
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