|Original language||English (US)|
|Title of host publication||IEEE/ACM Design Automation Test in Europe Conference (DATE) 2020|
|Publisher||Institute of Electrical and Electronics Engineers Inc.|
|State||Accepted/In press - Mar 30 2020|
Sinanoglu, O., & Limaye, N. (Accepted/In press). DynUnlock: Unlocking Scan Chains Obfuscated using Dynamic Keys. In IEEE/ACM Design Automation Test in Europe Conference (DATE) 2020 Institute of Electrical and Electronics Engineers Inc..