DynUnlock: Unlocking Scan Chains Obfuscated using Dynamic Keys

Ozgur Sinanoglu, Nimisha Limaye

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish (US)
Title of host publicationIEEE/ACM Design Automation Test in Europe Conference (DATE) 2020
PublisherInstitute of Electrical and Electronics Engineers Inc.
StateAccepted/In press - Mar 30 2020

Cite this

Sinanoglu, O., & Limaye, N. (Accepted/In press). DynUnlock: Unlocking Scan Chains Obfuscated using Dynamic Keys. In IEEE/ACM Design Automation Test in Europe Conference (DATE) 2020 Institute of Electrical and Electronics Engineers Inc..