Double layer relaxation at rough electrodes

Amy E. Larsen, David G. Grier, Thomas C. Halsey

    Research output: Contribution to journalArticle

    Abstract

    We describe measurements of the complex admittance of the interface between electrodeposited fractal electrodes and electrolytic solutions over the frequency range 100 Hz to 100 kHz. Scaling with a single size-dependent frequency collapses these data onto a universal curve. This scaling collapse provides quantitative support for the Halsey-Leibig theory for constant phase angle behavior and a technique for measuring the multifractal descriptors Df and (2) for such electrodes. [Df is the rough electrodes fractal dimension, and the multifractal exponent (2) is the correlation dimension of the surfaces harmonic measure.]

    Original languageEnglish (US)
    JournalPhysical Review E
    Volume52
    Issue number3
    DOIs
    StatePublished - 1995

    Fingerprint

    Rough
    Electrode
    electrodes
    fractals
    Scaling
    scaling
    Harmonic Measure
    Correlation Dimension
    electrical impedance
    Fractal Dimension
    Descriptors
    Fractal
    phase shift
    frequency ranges
    Exponent
    exponents
    harmonics
    Angle
    Curve
    Dependent

    ASJC Scopus subject areas

    • Mathematical Physics
    • Physics and Astronomy(all)
    • Condensed Matter Physics
    • Statistical and Nonlinear Physics

    Cite this

    Double layer relaxation at rough electrodes. / Larsen, Amy E.; Grier, David G.; Halsey, Thomas C.

    In: Physical Review E, Vol. 52, No. 3, 1995.

    Research output: Contribution to journalArticle

    Larsen, Amy E. ; Grier, David G. ; Halsey, Thomas C. / Double layer relaxation at rough electrodes. In: Physical Review E. 1995 ; Vol. 52, No. 3.
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