Diagnosis, modeling and tolerance of scan chain hold-time violations

Ozgur Sinanoglu, Philip Schremmer

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Errors in timing closure process during the physical design stage may result in systematic silicon failures, such as scan chain hold time violations, which prohibit the test of manufactured chips. In this paper, we propose a set of techniques that enable the accurate pinpointing of hold time violating scan cells, their modeling and tolerance, paving the way for the generation of valid test data that can be used to test chips with such systematic failures. The process yield is thus restored, as chips that are functional in mission mode can still be identified and shipped out, despite the existence of scan chain hold time failures. The techniques that we propose are non-intrusive, as they utilize only basic scan capabilities, and thus impose no design changes. Scan cells with hold time violations can be identified with maximal possible resolution, enabling the incorporation of the associated impact during the ATPG process and thus the generation of valid test data for the chips with such systematic failures.

Original languageEnglish (US)
Title of host publicationProceedings - 2007 Design, Automation and Test in Europe Conference and Exhibition, DATE 2007
Pages516-521
Number of pages6
DOIs
StatePublished - Sep 4 2007
Event2007 Design, Automation and Test in Europe Conference and Exhibition - Nice Acropolis, France
Duration: Apr 16 2007Apr 20 2007

Other

Other2007 Design, Automation and Test in Europe Conference and Exhibition
CountryFrance
CityNice Acropolis
Period4/16/074/20/07

Fingerprint

Silicon

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Sinanoglu, O., & Schremmer, P. (2007). Diagnosis, modeling and tolerance of scan chain hold-time violations. In Proceedings - 2007 Design, Automation and Test in Europe Conference and Exhibition, DATE 2007 (pp. 516-521). [4211850] https://doi.org/10.1109/DATE.2007.364645

Diagnosis, modeling and tolerance of scan chain hold-time violations. / Sinanoglu, Ozgur; Schremmer, Philip.

Proceedings - 2007 Design, Automation and Test in Europe Conference and Exhibition, DATE 2007. 2007. p. 516-521 4211850.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Sinanoglu, O & Schremmer, P 2007, Diagnosis, modeling and tolerance of scan chain hold-time violations. in Proceedings - 2007 Design, Automation and Test in Europe Conference and Exhibition, DATE 2007., 4211850, pp. 516-521, 2007 Design, Automation and Test in Europe Conference and Exhibition, Nice Acropolis, France, 4/16/07. https://doi.org/10.1109/DATE.2007.364645
Sinanoglu O, Schremmer P. Diagnosis, modeling and tolerance of scan chain hold-time violations. In Proceedings - 2007 Design, Automation and Test in Europe Conference and Exhibition, DATE 2007. 2007. p. 516-521. 4211850 https://doi.org/10.1109/DATE.2007.364645
Sinanoglu, Ozgur ; Schremmer, Philip. / Diagnosis, modeling and tolerance of scan chain hold-time violations. Proceedings - 2007 Design, Automation and Test in Europe Conference and Exhibition, DATE 2007. 2007. pp. 516-521
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