DfST: Design for secure testability

Samah Mohamed Saeed, Ozgur Sinanoglu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

While manufacturing test necessitates deep access into the Integrated Circuit (IC) to enhance its testability, this can inadvertently threaten the security of the IC in security-critical applications. Although black-box testing ensures security, it fails to deliver high-quality test. Therefore, our goal is to come up with DFT techniques that deliver testability without compromising the security of the IC.We propose various DFT techniques that tackle the testing challenges, such as test time, test data volume, and test power. Furthermore, we propose different scan attacks, which circumvent the security of the IC in the presence of advanced DFT techniques. We identify the limitations of our proposed scan attacks to develop countermeasures that can thwart these attacks.

Original languageEnglish (US)
Title of host publicationProceedings - 2014 IEEE International Test Conference, ITC 2014
PublisherInstitute of Electrical and Electronics Engineers Inc.
Volume2015-February
ISBN (Electronic)9781479947225
DOIs
StatePublished - Feb 6 2015
Event45th IEEE International Test Conference, ITC 2014 - Seattle, United States
Duration: Oct 21 2014Oct 23 2014

Other

Other45th IEEE International Test Conference, ITC 2014
CountryUnited States
CitySeattle
Period10/21/1410/23/14

Fingerprint

Integrated circuits
Integrated Circuits
Discrete Fourier transforms
Attack
Black-box testing
Black-box Testing
Countermeasures
Manufacturing
Design
Testing

ASJC Scopus subject areas

  • Applied Mathematics
  • Electrical and Electronic Engineering

Cite this

Saeed, S. M., & Sinanoglu, O. (2015). DfST: Design for secure testability. In Proceedings - 2014 IEEE International Test Conference, ITC 2014 (Vol. 2015-February). [7035365] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/TEST.2014.7035365

DfST : Design for secure testability. / Saeed, Samah Mohamed; Sinanoglu, Ozgur.

Proceedings - 2014 IEEE International Test Conference, ITC 2014. Vol. 2015-February Institute of Electrical and Electronics Engineers Inc., 2015. 7035365.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Saeed, SM & Sinanoglu, O 2015, DfST: Design for secure testability. in Proceedings - 2014 IEEE International Test Conference, ITC 2014. vol. 2015-February, 7035365, Institute of Electrical and Electronics Engineers Inc., 45th IEEE International Test Conference, ITC 2014, Seattle, United States, 10/21/14. https://doi.org/10.1109/TEST.2014.7035365
Saeed SM, Sinanoglu O. DfST: Design for secure testability. In Proceedings - 2014 IEEE International Test Conference, ITC 2014. Vol. 2015-February. Institute of Electrical and Electronics Engineers Inc. 2015. 7035365 https://doi.org/10.1109/TEST.2014.7035365
Saeed, Samah Mohamed ; Sinanoglu, Ozgur. / DfST : Design for secure testability. Proceedings - 2014 IEEE International Test Conference, ITC 2014. Vol. 2015-February Institute of Electrical and Electronics Engineers Inc., 2015.
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