Design and analysis of ring oscillator based Design-for-Trust technique

Jeyavijayan Rajendran, Vinayaka Jyothi, Ozgur Sinanoglu, Ramesh Karri

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Due to the increasing opportunities for malicious inclusions in hardware, Design-for-Trust (DFTr) is emerging as an important IC design methodology. In order to incorporate the DFTr techniques into the IC development cycle, they have to be practical in terms of their Trojan detection capabilities, hardware overhead, and test cost. We propose a non-invasive DFTr technique, which can detect Trojans in the presence of process variations and measurement errors. This technique can detect Trojans that are inserted in all or a subset of the ICs. It is applicable to both ASICs and FPGA implementations. Circuit paths in a design are reconfigured into ring oscillators1 (ROs) by adding a small amount of logic. Trojans are detected by observing the changes in the frequency of the ROs. An algorithm is provided to secure all the gates, while reducing the hardware overhead. We analyzed the coverage, area and test time overhead of the proposed DFTr technique. To demonstrate its effectiveness in the real world, the proposed technique had been validated by a red-team blue-team approach.

Original languageEnglish (US)
Title of host publicationProceedings - 2011 29th IEEE VLSI Test Symposium, VTS 2011
Pages105-110
Number of pages6
DOIs
StatePublished - Jul 1 2011
Event2011 29th IEEE VLSI Test Symposium, VTS 2011 - Dana Point, CA, United States
Duration: May 1 2011May 5 2011

Publication series

NameProceedings of the IEEE VLSI Test Symposium

Other

Other2011 29th IEEE VLSI Test Symposium, VTS 2011
CountryUnited States
CityDana Point, CA
Period5/1/115/5/11

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ASJC Scopus subject areas

  • Computer Science Applications
  • Electrical and Electronic Engineering

Cite this

Rajendran, J., Jyothi, V., Sinanoglu, O., & Karri, R. (2011). Design and analysis of ring oscillator based Design-for-Trust technique. In Proceedings - 2011 29th IEEE VLSI Test Symposium, VTS 2011 (pp. 105-110). [5783766] (Proceedings of the IEEE VLSI Test Symposium). https://doi.org/10.1109/VTS.2011.5783766