Cross-layer reliability modeling and optimization for embedded systems under process variations

Siddharth Garg, Puneet Gupta, Hiren D. Patel, Muhammad Shafique

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish (US)
Title of host publication2013 Proceedings of the International Conference on Embedded Software, EMSOFT 2013
PublisherIEEE Computer Society
ISBN (Print)9781479914432
DOIs
StatePublished - 2013
Event13th International Conference on Embedded Software, EMSOFT 2013 - Montreal, QC, Canada
Duration: Sep 29 2013Oct 4 2013

Other

Other13th International Conference on Embedded Software, EMSOFT 2013
CountryCanada
CityMontreal, QC
Period9/29/1310/4/13

Fingerprint

Embedded systems

ASJC Scopus subject areas

  • Software

Cite this

Garg, S., Gupta, P., Patel, H. D., & Shafique, M. (2013). Cross-layer reliability modeling and optimization for embedded systems under process variations. In 2013 Proceedings of the International Conference on Embedded Software, EMSOFT 2013 [6658578] IEEE Computer Society. https://doi.org/10.1109/EMSOFT.2013.6658578

Cross-layer reliability modeling and optimization for embedded systems under process variations. / Garg, Siddharth; Gupta, Puneet; Patel, Hiren D.; Shafique, Muhammad.

2013 Proceedings of the International Conference on Embedded Software, EMSOFT 2013. IEEE Computer Society, 2013. 6658578.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Garg, S, Gupta, P, Patel, HD & Shafique, M 2013, Cross-layer reliability modeling and optimization for embedded systems under process variations. in 2013 Proceedings of the International Conference on Embedded Software, EMSOFT 2013., 6658578, IEEE Computer Society, 13th International Conference on Embedded Software, EMSOFT 2013, Montreal, QC, Canada, 9/29/13. https://doi.org/10.1109/EMSOFT.2013.6658578
Garg S, Gupta P, Patel HD, Shafique M. Cross-layer reliability modeling and optimization for embedded systems under process variations. In 2013 Proceedings of the International Conference on Embedded Software, EMSOFT 2013. IEEE Computer Society. 2013. 6658578 https://doi.org/10.1109/EMSOFT.2013.6658578
Garg, Siddharth ; Gupta, Puneet ; Patel, Hiren D. ; Shafique, Muhammad. / Cross-layer reliability modeling and optimization for embedded systems under process variations. 2013 Proceedings of the International Conference on Embedded Software, EMSOFT 2013. IEEE Computer Society, 2013.
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