Correction scheme for multiple correlated statistical tests in local shape analysis

Martin Styner, Guido Gerig

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Abstract

    In neuroimaging research shape analysis has become a field of great interest due to the ability to locate morpho-logical brain changes between different groups. Currently, many local shape analysis approaches fail to correct for their high number of correlated statistical tests. This can result in an overly optimistic estimate of the local shape analysis. This paper presents a correction scheme for objects described by the parametrized 3D closed surface description SPHARM. The SPHARM parameterization was determined via area preserving, minimal distortion optimization. The correction scheme decomposes the object surface into overlapping planar images via a cylindrical equal area projection of the parameterization. The images are individually analyzed with the SnPM/SPM package using a voxel-level non-parametric multiple testing procedure based on permutation tests. The correction scheme employs conservative tests resulting in a pessimistic estimate. We present an application of the correction scheme to the shape similarity analysis of lateral ventricles.

    Original languageEnglish (US)
    Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
    EditorsJ.M. Fitzpatrick, M. Sonka
    Pages233-240
    Number of pages8
    Volume5370 I
    DOIs
    StatePublished - 2004
    EventProgress in Biomedical Optics and Imaging - Medical Imaging 2004: Imaging Processing - San Diego, CA, United States
    Duration: Feb 16 2004Feb 19 2004

    Other

    OtherProgress in Biomedical Optics and Imaging - Medical Imaging 2004: Imaging Processing
    CountryUnited States
    CitySan Diego, CA
    Period2/16/042/19/04

    Fingerprint

    statistical tests
    Statistical tests
    Parameterization
    Neuroimaging
    parameterization
    Brain
    permutations
    Testing
    estimates
    preserving
    brain
    projection
    optimization

    Keywords

    • Multiple comparison problem
    • Shape analysis
    • Statistical non-parametric tests

    ASJC Scopus subject areas

    • Electrical and Electronic Engineering
    • Condensed Matter Physics

    Cite this

    Styner, M., & Gerig, G. (2004). Correction scheme for multiple correlated statistical tests in local shape analysis. In J. M. Fitzpatrick, & M. Sonka (Eds.), Proceedings of SPIE - The International Society for Optical Engineering (Vol. 5370 I, pp. 233-240) https://doi.org/10.1117/12.533026

    Correction scheme for multiple correlated statistical tests in local shape analysis. / Styner, Martin; Gerig, Guido.

    Proceedings of SPIE - The International Society for Optical Engineering. ed. / J.M. Fitzpatrick; M. Sonka. Vol. 5370 I 2004. p. 233-240.

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Styner, M & Gerig, G 2004, Correction scheme for multiple correlated statistical tests in local shape analysis. in JM Fitzpatrick & M Sonka (eds), Proceedings of SPIE - The International Society for Optical Engineering. vol. 5370 I, pp. 233-240, Progress in Biomedical Optics and Imaging - Medical Imaging 2004: Imaging Processing, San Diego, CA, United States, 2/16/04. https://doi.org/10.1117/12.533026
    Styner M, Gerig G. Correction scheme for multiple correlated statistical tests in local shape analysis. In Fitzpatrick JM, Sonka M, editors, Proceedings of SPIE - The International Society for Optical Engineering. Vol. 5370 I. 2004. p. 233-240 https://doi.org/10.1117/12.533026
    Styner, Martin ; Gerig, Guido. / Correction scheme for multiple correlated statistical tests in local shape analysis. Proceedings of SPIE - The International Society for Optical Engineering. editor / J.M. Fitzpatrick ; M. Sonka. Vol. 5370 I 2004. pp. 233-240
    @inproceedings{5ec003612559451c8b302e91045cd4e7,
    title = "Correction scheme for multiple correlated statistical tests in local shape analysis",
    abstract = "In neuroimaging research shape analysis has become a field of great interest due to the ability to locate morpho-logical brain changes between different groups. Currently, many local shape analysis approaches fail to correct for their high number of correlated statistical tests. This can result in an overly optimistic estimate of the local shape analysis. This paper presents a correction scheme for objects described by the parametrized 3D closed surface description SPHARM. The SPHARM parameterization was determined via area preserving, minimal distortion optimization. The correction scheme decomposes the object surface into overlapping planar images via a cylindrical equal area projection of the parameterization. The images are individually analyzed with the SnPM/SPM package using a voxel-level non-parametric multiple testing procedure based on permutation tests. The correction scheme employs conservative tests resulting in a pessimistic estimate. We present an application of the correction scheme to the shape similarity analysis of lateral ventricles.",
    keywords = "Multiple comparison problem, Shape analysis, Statistical non-parametric tests",
    author = "Martin Styner and Guido Gerig",
    year = "2004",
    doi = "10.1117/12.533026",
    language = "English (US)",
    volume = "5370 I",
    pages = "233--240",
    editor = "J.M. Fitzpatrick and M. Sonka",
    booktitle = "Proceedings of SPIE - The International Society for Optical Engineering",

    }

    TY - GEN

    T1 - Correction scheme for multiple correlated statistical tests in local shape analysis

    AU - Styner, Martin

    AU - Gerig, Guido

    PY - 2004

    Y1 - 2004

    N2 - In neuroimaging research shape analysis has become a field of great interest due to the ability to locate morpho-logical brain changes between different groups. Currently, many local shape analysis approaches fail to correct for their high number of correlated statistical tests. This can result in an overly optimistic estimate of the local shape analysis. This paper presents a correction scheme for objects described by the parametrized 3D closed surface description SPHARM. The SPHARM parameterization was determined via area preserving, minimal distortion optimization. The correction scheme decomposes the object surface into overlapping planar images via a cylindrical equal area projection of the parameterization. The images are individually analyzed with the SnPM/SPM package using a voxel-level non-parametric multiple testing procedure based on permutation tests. The correction scheme employs conservative tests resulting in a pessimistic estimate. We present an application of the correction scheme to the shape similarity analysis of lateral ventricles.

    AB - In neuroimaging research shape analysis has become a field of great interest due to the ability to locate morpho-logical brain changes between different groups. Currently, many local shape analysis approaches fail to correct for their high number of correlated statistical tests. This can result in an overly optimistic estimate of the local shape analysis. This paper presents a correction scheme for objects described by the parametrized 3D closed surface description SPHARM. The SPHARM parameterization was determined via area preserving, minimal distortion optimization. The correction scheme decomposes the object surface into overlapping planar images via a cylindrical equal area projection of the parameterization. The images are individually analyzed with the SnPM/SPM package using a voxel-level non-parametric multiple testing procedure based on permutation tests. The correction scheme employs conservative tests resulting in a pessimistic estimate. We present an application of the correction scheme to the shape similarity analysis of lateral ventricles.

    KW - Multiple comparison problem

    KW - Shape analysis

    KW - Statistical non-parametric tests

    UR - http://www.scopus.com/inward/record.url?scp=5644273075&partnerID=8YFLogxK

    UR - http://www.scopus.com/inward/citedby.url?scp=5644273075&partnerID=8YFLogxK

    U2 - 10.1117/12.533026

    DO - 10.1117/12.533026

    M3 - Conference contribution

    AN - SCOPUS:5644273075

    VL - 5370 I

    SP - 233

    EP - 240

    BT - Proceedings of SPIE - The International Society for Optical Engineering

    A2 - Fitzpatrick, J.M.

    A2 - Sonka, M.

    ER -