Correction for piezoelectric creep in scanning probe microscopy images using polynomial mapping

Matthew L. Trawick, Mischa Megens, Christopher Harrison, Dan E. Angelescu, Daniel A. Vega, Paul M. Chaikin, Richard A. Register, Douglas H. Adamson

    Research output: Contribution to journalArticle

    Abstract

    We describe a method for using polynomial mapping to correct scanning probe microscope images for distortion due to piezoelectric creep. Because such distortion varies from image to image, this method can be used when the actual locations of some features within an image are known absolutely, or in a series of images in which the actual locations of some features are known not to vary. While the general case of polynomial mapping of degree N requires the determination of 2(N+1)2 matrix elements by regression, we find that by understanding the mechanism by which piezoelectric creep distorts scanning probe microscope images, we can fix most of these coefficients at 0 or 1 a priori, leaving only 2(N+1) coefficients to be determined by regression. We describe our implementation of this strategy using the Interactive Data Language (IDL) programming language, and demonstrate our technique on a series of atomic force microscopy (AFM) images of diblock copolymer microdomains. Using our simplified scheme, we are able to reduce the effects of distortion in an AFM image from 5% of the scan width to a single pixel, using only five reference points.

    Original languageEnglish (US)
    Pages (from-to)25-33
    Number of pages9
    JournalScanning
    Volume25
    Issue number1
    StatePublished - Jan 2003

    Fingerprint

    Scanning probe microscopy
    Creep
    polynomials
    Polynomials
    microscopy
    scanning
    probes
    Atomic force microscopy
    Microscopes
    Scanning
    Computer programming languages
    Block copolymers
    Pixels
    language programming
    regression analysis
    microscopes
    atomic force microscopy
    programming languages
    coefficients
    fixing

    Keywords

    • Distortion
    • Image processing
    • Piezoelectric creep
    • Polynomial mapping
    • Scanning probe microscopy

    ASJC Scopus subject areas

    • Instrumentation

    Cite this

    Trawick, M. L., Megens, M., Harrison, C., Angelescu, D. E., Vega, D. A., Chaikin, P. M., ... Adamson, D. H. (2003). Correction for piezoelectric creep in scanning probe microscopy images using polynomial mapping. Scanning, 25(1), 25-33.

    Correction for piezoelectric creep in scanning probe microscopy images using polynomial mapping. / Trawick, Matthew L.; Megens, Mischa; Harrison, Christopher; Angelescu, Dan E.; Vega, Daniel A.; Chaikin, Paul M.; Register, Richard A.; Adamson, Douglas H.

    In: Scanning, Vol. 25, No. 1, 01.2003, p. 25-33.

    Research output: Contribution to journalArticle

    Trawick, ML, Megens, M, Harrison, C, Angelescu, DE, Vega, DA, Chaikin, PM, Register, RA & Adamson, DH 2003, 'Correction for piezoelectric creep in scanning probe microscopy images using polynomial mapping', Scanning, vol. 25, no. 1, pp. 25-33.
    Trawick ML, Megens M, Harrison C, Angelescu DE, Vega DA, Chaikin PM et al. Correction for piezoelectric creep in scanning probe microscopy images using polynomial mapping. Scanning. 2003 Jan;25(1):25-33.
    Trawick, Matthew L. ; Megens, Mischa ; Harrison, Christopher ; Angelescu, Dan E. ; Vega, Daniel A. ; Chaikin, Paul M. ; Register, Richard A. ; Adamson, Douglas H. / Correction for piezoelectric creep in scanning probe microscopy images using polynomial mapping. In: Scanning. 2003 ; Vol. 25, No. 1. pp. 25-33.
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