Combined polarized Raman and atomic force microscopy: In situ study of point defects and mechanical properties in individual ZnO nanobelts

Marcel Lucas, Zhong Lin Wang, Elisa Riedo

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Point defects and mechanical properties in individual ZnO nanobelts were analyzed using combined polarized Raman and atomic force microscopy. The ZnO NBs were fabricated by physical vapor deposition (PVD) without catalysts and deposited on a glass cover slip. The cover slip was glued to the bottom of a Petri dish, in which a hole was drilled to allow the laser beam to go through it. The morphology and mechanical properties of the ZnO NBs were characterized with an Agilent PicoPlus atomic force microscopy (AFM). The AFM was placed on top of an Olympus IX71 inverted optical microscope using a quickslide stage. Additional series of PR spectra for the ZnO NBs were collected where the incident polarization is rotated and the ZnO NB axis remained parallel or perpendicular to the analyzed scattered polarization. The results show that polarized Raman-AFM offers an in situ and nondestructive tool for the complete characterization of the crystal structure and the physical properties of individual nanostructures that can be in asfabricated nanodevices.

Original languageEnglish (US)
Article number051904
JournalApplied Physics Letters
Issue number5
StatePublished - Aug 31 2009


ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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