Combined polarized Raman and atomic force microscopy: In situ study of point defects and mechanical properties in individual ZnO nanobelts

Marcel Lucas, Zhong Lin Wang, Elisa Riedo

Research output: Contribution to journalArticle

Abstract

Point defects and mechanical properties in individual ZnO nanobelts were analyzed using combined polarized Raman and atomic force microscopy. The ZnO NBs were fabricated by physical vapor deposition (PVD) without catalysts and deposited on a glass cover slip. The cover slip was glued to the bottom of a Petri dish, in which a hole was drilled to allow the laser beam to go through it. The morphology and mechanical properties of the ZnO NBs were characterized with an Agilent PicoPlus atomic force microscopy (AFM). The AFM was placed on top of an Olympus IX71 inverted optical microscope using a quickslide stage. Additional series of PR spectra for the ZnO NBs were collected where the incident polarization is rotated and the ZnO NB axis remained parallel or perpendicular to the analyzed scattered polarization. The results show that polarized Raman-AFM offers an in situ and nondestructive tool for the complete characterization of the crystal structure and the physical properties of individual nanostructures that can be in asfabricated nanodevices.

Original languageEnglish (US)
Article number051904
JournalApplied Physics Letters
Volume95
Issue number5
DOIs
StatePublished - Aug 31 2009

Fingerprint

point defects
atomic force microscopy
mechanical properties
slip
parabolic reflectors
polarization
optical microscopes
physical properties
vapor deposition
laser beams
catalysts
crystal structure
glass

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Cite this

Combined polarized Raman and atomic force microscopy : In situ study of point defects and mechanical properties in individual ZnO nanobelts. / Lucas, Marcel; Wang, Zhong Lin; Riedo, Elisa.

In: Applied Physics Letters, Vol. 95, No. 5, 051904, 31.08.2009.

Research output: Contribution to journalArticle

@article{89fc85263b624d398d5b1379a052637f,
title = "Combined polarized Raman and atomic force microscopy: In situ study of point defects and mechanical properties in individual ZnO nanobelts",
abstract = "Point defects and mechanical properties in individual ZnO nanobelts were analyzed using combined polarized Raman and atomic force microscopy. The ZnO NBs were fabricated by physical vapor deposition (PVD) without catalysts and deposited on a glass cover slip. The cover slip was glued to the bottom of a Petri dish, in which a hole was drilled to allow the laser beam to go through it. The morphology and mechanical properties of the ZnO NBs were characterized with an Agilent PicoPlus atomic force microscopy (AFM). The AFM was placed on top of an Olympus IX71 inverted optical microscope using a quickslide stage. Additional series of PR spectra for the ZnO NBs were collected where the incident polarization is rotated and the ZnO NB axis remained parallel or perpendicular to the analyzed scattered polarization. The results show that polarized Raman-AFM offers an in situ and nondestructive tool for the complete characterization of the crystal structure and the physical properties of individual nanostructures that can be in asfabricated nanodevices.",
author = "Marcel Lucas and Wang, {Zhong Lin} and Elisa Riedo",
year = "2009",
month = "8",
day = "31",
doi = "10.1063/1.3177065",
language = "English (US)",
volume = "95",
journal = "Applied Physics Letters",
issn = "0003-6951",
publisher = "American Institute of Physics Publising LLC",
number = "5",

}

TY - JOUR

T1 - Combined polarized Raman and atomic force microscopy

T2 - In situ study of point defects and mechanical properties in individual ZnO nanobelts

AU - Lucas, Marcel

AU - Wang, Zhong Lin

AU - Riedo, Elisa

PY - 2009/8/31

Y1 - 2009/8/31

N2 - Point defects and mechanical properties in individual ZnO nanobelts were analyzed using combined polarized Raman and atomic force microscopy. The ZnO NBs were fabricated by physical vapor deposition (PVD) without catalysts and deposited on a glass cover slip. The cover slip was glued to the bottom of a Petri dish, in which a hole was drilled to allow the laser beam to go through it. The morphology and mechanical properties of the ZnO NBs were characterized with an Agilent PicoPlus atomic force microscopy (AFM). The AFM was placed on top of an Olympus IX71 inverted optical microscope using a quickslide stage. Additional series of PR spectra for the ZnO NBs were collected where the incident polarization is rotated and the ZnO NB axis remained parallel or perpendicular to the analyzed scattered polarization. The results show that polarized Raman-AFM offers an in situ and nondestructive tool for the complete characterization of the crystal structure and the physical properties of individual nanostructures that can be in asfabricated nanodevices.

AB - Point defects and mechanical properties in individual ZnO nanobelts were analyzed using combined polarized Raman and atomic force microscopy. The ZnO NBs were fabricated by physical vapor deposition (PVD) without catalysts and deposited on a glass cover slip. The cover slip was glued to the bottom of a Petri dish, in which a hole was drilled to allow the laser beam to go through it. The morphology and mechanical properties of the ZnO NBs were characterized with an Agilent PicoPlus atomic force microscopy (AFM). The AFM was placed on top of an Olympus IX71 inverted optical microscope using a quickslide stage. Additional series of PR spectra for the ZnO NBs were collected where the incident polarization is rotated and the ZnO NB axis remained parallel or perpendicular to the analyzed scattered polarization. The results show that polarized Raman-AFM offers an in situ and nondestructive tool for the complete characterization of the crystal structure and the physical properties of individual nanostructures that can be in asfabricated nanodevices.

UR - http://www.scopus.com/inward/record.url?scp=69249121699&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=69249121699&partnerID=8YFLogxK

U2 - 10.1063/1.3177065

DO - 10.1063/1.3177065

M3 - Article

VL - 95

JO - Applied Physics Letters

JF - Applied Physics Letters

SN - 0003-6951

IS - 5

M1 - 051904

ER -