Chiroptical imaging of crystals by mueller matrix microscopy

John Freundenthal, Erica Gunn, Bart Kahr

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Mueller matrix microscopy is evaluated as a tool for characterizing the heterogeneities and anisotropies of chiroptical properties of crystalline and polycrystalline materials.

Original languageEnglish (US)
Title of host publicationLaser Science, LS 2009
PublisherOptical Society of America
ISBN (Print)9781557528780
StatePublished - 2009
EventLaser Science, LS 2009 - San Jose, CA, United States
Duration: Oct 11 2009Oct 15 2009

Other

OtherLaser Science, LS 2009
CountryUnited States
CitySan Jose, CA
Period10/11/0910/15/09

Fingerprint

Polycrystalline materials
Microscopic examination
Anisotropy
Crystalline materials
microscopy
Imaging techniques
Crystals
anisotropy
matrices
crystals

ASJC Scopus subject areas

  • Instrumentation
  • Atomic and Molecular Physics, and Optics

Cite this

Freundenthal, J., Gunn, E., & Kahr, B. (2009). Chiroptical imaging of crystals by mueller matrix microscopy. In Laser Science, LS 2009 Optical Society of America.

Chiroptical imaging of crystals by mueller matrix microscopy. / Freundenthal, John; Gunn, Erica; Kahr, Bart.

Laser Science, LS 2009. Optical Society of America, 2009.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Freundenthal, J, Gunn, E & Kahr, B 2009, Chiroptical imaging of crystals by mueller matrix microscopy. in Laser Science, LS 2009. Optical Society of America, Laser Science, LS 2009, San Jose, CA, United States, 10/11/09.
Freundenthal J, Gunn E, Kahr B. Chiroptical imaging of crystals by mueller matrix microscopy. In Laser Science, LS 2009. Optical Society of America. 2009
Freundenthal, John ; Gunn, Erica ; Kahr, Bart. / Chiroptical imaging of crystals by mueller matrix microscopy. Laser Science, LS 2009. Optical Society of America, 2009.
@inproceedings{db07b0bb17ff4b8ebef580982d5fdae9,
title = "Chiroptical imaging of crystals by mueller matrix microscopy",
abstract = "Mueller matrix microscopy is evaluated as a tool for characterizing the heterogeneities and anisotropies of chiroptical properties of crystalline and polycrystalline materials.",
author = "John Freundenthal and Erica Gunn and Bart Kahr",
year = "2009",
language = "English (US)",
isbn = "9781557528780",
booktitle = "Laser Science, LS 2009",
publisher = "Optical Society of America",

}

TY - GEN

T1 - Chiroptical imaging of crystals by mueller matrix microscopy

AU - Freundenthal, John

AU - Gunn, Erica

AU - Kahr, Bart

PY - 2009

Y1 - 2009

N2 - Mueller matrix microscopy is evaluated as a tool for characterizing the heterogeneities and anisotropies of chiroptical properties of crystalline and polycrystalline materials.

AB - Mueller matrix microscopy is evaluated as a tool for characterizing the heterogeneities and anisotropies of chiroptical properties of crystalline and polycrystalline materials.

UR - http://www.scopus.com/inward/record.url?scp=84897995687&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84897995687&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:84897995687

SN - 9781557528780

BT - Laser Science, LS 2009

PB - Optical Society of America

ER -