Characterization of atomic force microscope probes at low temperatures

Alexandra Radenovic, Eva Bystrenova, Laurent Libioulle, Francesco Valle, George Shubeita, Sandor Kasas, Giovanni Dietler

Research output: Contribution to journalArticle

Abstract

The different types of atomic force microscopy (AFM) probes were characterized under ultrahigh vacuum conditions. A temperature dependent shift of the peak frequency was observed. It was found that the chemical treatment of uncoated cantilevers does not cause bending at low temperatures.

Original languageEnglish (US)
Pages (from-to)4210-4214
Number of pages5
JournalJournal of Applied Physics
Volume94
Issue number6
DOIs
StatePublished - Sep 15 2003

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ultrahigh vacuum
microscopes
atomic force microscopy
probes
causes
shift
temperature

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

Radenovic, A., Bystrenova, E., Libioulle, L., Valle, F., Shubeita, G., Kasas, S., & Dietler, G. (2003). Characterization of atomic force microscope probes at low temperatures. Journal of Applied Physics, 94(6), 4210-4214. https://doi.org/10.1063/1.1604952

Characterization of atomic force microscope probes at low temperatures. / Radenovic, Alexandra; Bystrenova, Eva; Libioulle, Laurent; Valle, Francesco; Shubeita, George; Kasas, Sandor; Dietler, Giovanni.

In: Journal of Applied Physics, Vol. 94, No. 6, 15.09.2003, p. 4210-4214.

Research output: Contribution to journalArticle

Radenovic, A, Bystrenova, E, Libioulle, L, Valle, F, Shubeita, G, Kasas, S & Dietler, G 2003, 'Characterization of atomic force microscope probes at low temperatures', Journal of Applied Physics, vol. 94, no. 6, pp. 4210-4214. https://doi.org/10.1063/1.1604952
Radenovic A, Bystrenova E, Libioulle L, Valle F, Shubeita G, Kasas S et al. Characterization of atomic force microscope probes at low temperatures. Journal of Applied Physics. 2003 Sep 15;94(6):4210-4214. https://doi.org/10.1063/1.1604952
Radenovic, Alexandra ; Bystrenova, Eva ; Libioulle, Laurent ; Valle, Francesco ; Shubeita, George ; Kasas, Sandor ; Dietler, Giovanni. / Characterization of atomic force microscope probes at low temperatures. In: Journal of Applied Physics. 2003 ; Vol. 94, No. 6. pp. 4210-4214.
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