Characterization of atomic force microscope probes at low temperatures

Alexandra Radenovic, Eva Bystrenova, Laurent Libioulle, Francesco Valle, George T. Shubeita, Sandor Kasas, Giovanni Dietler

Research output: Contribution to journalArticle

Abstract

The different types of atomic force microscopy (AFM) probes were characterized under ultrahigh vacuum conditions. A temperature dependent shift of the peak frequency was observed. It was found that the chemical treatment of uncoated cantilevers does not cause bending at low temperatures.

Original languageEnglish (US)
Pages (from-to)4210-4214
Number of pages5
JournalJournal of Applied Physics
Volume94
Issue number6
DOIs
StatePublished - Sep 15 2003

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ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

Radenovic, A., Bystrenova, E., Libioulle, L., Valle, F., Shubeita, G. T., Kasas, S., & Dietler, G. (2003). Characterization of atomic force microscope probes at low temperatures. Journal of Applied Physics, 94(6), 4210-4214. https://doi.org/10.1063/1.1604952