Challenges and approaches to on-chip millimeter wave antenna pattern measurements

James Murdock, Eshar Ben-Dor, Felix Gutierrez, Theodore S. Rappaport

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We present two methods to remove wafer probe interference radiation from measured on-chip antenna patterns performed in a probe station environment. On-chip antenna pattern and gain measurements are affected by parasitic probe tip radiation as well as scattered energy from the metal probe station environment. In this work, we use superposition and S-parameter techniques to de-embed the effects of probe tip radiation. On-chip Dipole, Yagi, and Rhombic antennas were fabricated using standard 180nm CMOS, and radiation patterns were measured at 60 GHz. This work shows methods that improve the ability to reliably design, predict, and measure on-chip antenna patterns.

Original languageEnglish (US)
Title of host publication2011 IEEE MTT-S International Microwave Symposium, IMS 2011
DOIs
StatePublished - 2011
Event2011 IEEE MTT-S International Microwave Symposium, IMS 2011 - Baltimore, MD, United States
Duration: Jun 5 2011Jun 10 2011

Other

Other2011 IEEE MTT-S International Microwave Symposium, IMS 2011
CountryUnited States
CityBaltimore, MD
Period6/5/116/10/11

Fingerprint

Directional patterns (antenna)
Millimeter waves
millimeter waves
antennas
chips
probes
radiation
Radiation
rhombic antennas
stations
Yagi antennas
Gain measurement
dipole antennas
Scattering parameters
CMOS
wafers
Antennas
interference
Metals
metals

Keywords

  • Antenna radiation patterns
  • CMOS process
  • de-embedding techniques
  • electromagnetic radiative interference
  • integrated antennas
  • millimeter wave antennas
  • millimeter wave integrated circuits
  • on-chip antennas
  • probe radiation

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Radiation
  • Condensed Matter Physics

Cite this

Murdock, J., Ben-Dor, E., Gutierrez, F., & Rappaport, T. S. (2011). Challenges and approaches to on-chip millimeter wave antenna pattern measurements. In 2011 IEEE MTT-S International Microwave Symposium, IMS 2011 [5972965] https://doi.org/10.1109/MWSYM.2011.5972965

Challenges and approaches to on-chip millimeter wave antenna pattern measurements. / Murdock, James; Ben-Dor, Eshar; Gutierrez, Felix; Rappaport, Theodore S.

2011 IEEE MTT-S International Microwave Symposium, IMS 2011. 2011. 5972965.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Murdock, J, Ben-Dor, E, Gutierrez, F & Rappaport, TS 2011, Challenges and approaches to on-chip millimeter wave antenna pattern measurements. in 2011 IEEE MTT-S International Microwave Symposium, IMS 2011., 5972965, 2011 IEEE MTT-S International Microwave Symposium, IMS 2011, Baltimore, MD, United States, 6/5/11. https://doi.org/10.1109/MWSYM.2011.5972965
Murdock J, Ben-Dor E, Gutierrez F, Rappaport TS. Challenges and approaches to on-chip millimeter wave antenna pattern measurements. In 2011 IEEE MTT-S International Microwave Symposium, IMS 2011. 2011. 5972965 https://doi.org/10.1109/MWSYM.2011.5972965
Murdock, James ; Ben-Dor, Eshar ; Gutierrez, Felix ; Rappaport, Theodore S. / Challenges and approaches to on-chip millimeter wave antenna pattern measurements. 2011 IEEE MTT-S International Microwave Symposium, IMS 2011. 2011.
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