Calibration of a vacuum ultraviolet (VUV) polarization analyser

M. Uhrig, S. Hoernemann, M. Klose, K. Becker, G. F. Hanne

Research output: Contribution to journalArticle

Abstract

A straightforward, in situ calibration procedure for a vacuum ultraviolet (VUV) double-reflection polarization analyser is introduced which does not require knowledge of the optical properties of the reflecting materials or previously measured benchmark polarizations. The linear and circular polarization sensitivities of the analyser are determined from VUV light intensity measurements obtained for various mutual orientations of the two reflecting surfaces. As an example of the reliability of the calibration procedure, measurements of integrated Stokes parameters are presented and compared with the results of measurements carried out previously by other groups using different polarization analysers.

Original languageEnglish (US)
Article number009
Pages (from-to)1239-1247
Number of pages9
JournalMeasurement Science and Technology
Volume5
Issue number10
DOIs
StatePublished - Dec 1 1994

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ASJC Scopus subject areas

  • Instrumentation
  • Engineering (miscellaneous)
  • Applied Mathematics

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