Calculated cross-sections for the electron-impact detachment from negative ions using the Deutsch-Märk (DM) formalism

H. Deutsch, P. Scheier, K. Becker, T. D. Märk

Research output: Contribution to journalArticle

Abstract

The DM formalism originally developed for the calculation of electron impact ionization cross-sections of neutral targets and positive ions, is extended here to negative atomic ions. We use a fitting procedure based on the (few) available experimental data for H-, B-, C -, and F- to determine the set of additional empirical parameters required for the application of the DM formalism for negative ion targets. Subsequently, those parameters were used to calculate the O - detachment cross-section, for which two sets of experimental data are available for comparison and the Li- detachment cross-section, for which no experimental data are available.

Original languageEnglish (US)
Pages (from-to)26-31
Number of pages6
JournalChemical Physics Letters
Volume382
Issue number1-2
DOIs
StatePublished - Nov 28 2003

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Impact ionization
detachment
negative ions
electron impact
Negative ions
Positive ions
Ions
formalism
Electrons
cross sections
ionization cross sections
positive ions
ions

ASJC Scopus subject areas

  • Physical and Theoretical Chemistry
  • Spectroscopy
  • Atomic and Molecular Physics, and Optics

Cite this

Calculated cross-sections for the electron-impact detachment from negative ions using the Deutsch-Märk (DM) formalism. / Deutsch, H.; Scheier, P.; Becker, K.; Märk, T. D.

In: Chemical Physics Letters, Vol. 382, No. 1-2, 28.11.2003, p. 26-31.

Research output: Contribution to journalArticle

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