Bulk crystals to surfaces: Combining X-ray diffraction and atomic force microscopy to probe the structure and formation of crystal interfaces

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Abstract

The characterization of crystal interfaces and organized molecular arrays were investigated with X-ray diffraction and atomic force microscopy. The combination of interface structure characterization, kinetic measurements and bulk single crystal X-ray diffraction enabled the elucidation of the growth of crystals. The study of the molecular properties of the organized interfaces were important for developing strategies for controlling nucleation of crystalline phases and for the synthesis of specific polymorphs and thin crystalline films.

Original languageEnglish (US)
Pages (from-to)1697-1725
Number of pages29
JournalChemical Reviews
Volume101
Issue number6
DOIs
StatePublished - Jun 2001

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Atomic force microscopy
Crystalline materials
X ray diffraction
Crystals
Crystallization
Polymorphism
Nucleation
Single crystals
Kinetics

ASJC Scopus subject areas

  • Chemistry(all)

Cite this

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title = "Bulk crystals to surfaces: Combining X-ray diffraction and atomic force microscopy to probe the structure and formation of crystal interfaces",
abstract = "The characterization of crystal interfaces and organized molecular arrays were investigated with X-ray diffraction and atomic force microscopy. The combination of interface structure characterization, kinetic measurements and bulk single crystal X-ray diffraction enabled the elucidation of the growth of crystals. The study of the molecular properties of the organized interfaces were important for developing strategies for controlling nucleation of crystalline phases and for the synthesis of specific polymorphs and thin crystalline films.",
author = "Michael Ward",
year = "2001",
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