Built-in self-test: A complete test solution for telecommunication systems

Nilanjan Mukherjee, Tapan J. Chakraborty, Ramesh Karri

Research output: Contribution to journalArticle

Abstract

The technological revolution witnessed by the telecommunications industry is leading to the development of new applications, products, and protocols, which in turn solicits widely accessible, highly reliable, and high-quality networks. To meet the stringent quality and reliability requirements of today's complex communication networks, efficient test methodologies are necessary at all levels (system, board, circuit, etc.). Conventional test methodologies are being constantly challenged by ever-increasing speed and circuit size, which results in high costs associated with test hardware, test generation, and test application time. Built-in self-test offers a test methodology where the test functions are embedded into the circuit itself. The advantages of using BIST for complex telecommunication systems are numerous. Reduced test development time, low test application time, eliminating the need for very-high-speed hardware testers, provision for at-speed tests, in-field test capability, and high fault coverage are some of them. In this article we present a tutorial on the BIST methodology targeted mainly toward telecommunication systems, the test structures necessary for its incorporation both at the circuit and system levels, and test implementation at the higher levels of design abstraction.

Original languageEnglish (US)
Pages (from-to)72-78
Number of pages7
JournalIEEE Communications Magazine
Volume37
Issue number6
DOIs
StatePublished - Jun 1999

Fingerprint

Built-in self test
Telecommunication systems
Networks (circuits)
Hardware
Telecommunication industry
Telecommunication networks
Costs

ASJC Scopus subject areas

  • Computer Networks and Communications
  • Electrical and Electronic Engineering

Cite this

Built-in self-test : A complete test solution for telecommunication systems. / Mukherjee, Nilanjan; Chakraborty, Tapan J.; Karri, Ramesh.

In: IEEE Communications Magazine, Vol. 37, No. 6, 06.1999, p. 72-78.

Research output: Contribution to journalArticle

Mukherjee, Nilanjan ; Chakraborty, Tapan J. ; Karri, Ramesh. / Built-in self-test : A complete test solution for telecommunication systems. In: IEEE Communications Magazine. 1999 ; Vol. 37, No. 6. pp. 72-78.
@article{acd9e1d85b7e49cc96bfb2f2671065eb,
title = "Built-in self-test: A complete test solution for telecommunication systems",
abstract = "The technological revolution witnessed by the telecommunications industry is leading to the development of new applications, products, and protocols, which in turn solicits widely accessible, highly reliable, and high-quality networks. To meet the stringent quality and reliability requirements of today's complex communication networks, efficient test methodologies are necessary at all levels (system, board, circuit, etc.). Conventional test methodologies are being constantly challenged by ever-increasing speed and circuit size, which results in high costs associated with test hardware, test generation, and test application time. Built-in self-test offers a test methodology where the test functions are embedded into the circuit itself. The advantages of using BIST for complex telecommunication systems are numerous. Reduced test development time, low test application time, eliminating the need for very-high-speed hardware testers, provision for at-speed tests, in-field test capability, and high fault coverage are some of them. In this article we present a tutorial on the BIST methodology targeted mainly toward telecommunication systems, the test structures necessary for its incorporation both at the circuit and system levels, and test implementation at the higher levels of design abstraction.",
author = "Nilanjan Mukherjee and Chakraborty, {Tapan J.} and Ramesh Karri",
year = "1999",
month = "6",
doi = "10.1109/35.769277",
language = "English (US)",
volume = "37",
pages = "72--78",
journal = "IEEE Communications Magazine",
issn = "0163-6804",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
number = "6",

}

TY - JOUR

T1 - Built-in self-test

T2 - A complete test solution for telecommunication systems

AU - Mukherjee, Nilanjan

AU - Chakraborty, Tapan J.

AU - Karri, Ramesh

PY - 1999/6

Y1 - 1999/6

N2 - The technological revolution witnessed by the telecommunications industry is leading to the development of new applications, products, and protocols, which in turn solicits widely accessible, highly reliable, and high-quality networks. To meet the stringent quality and reliability requirements of today's complex communication networks, efficient test methodologies are necessary at all levels (system, board, circuit, etc.). Conventional test methodologies are being constantly challenged by ever-increasing speed and circuit size, which results in high costs associated with test hardware, test generation, and test application time. Built-in self-test offers a test methodology where the test functions are embedded into the circuit itself. The advantages of using BIST for complex telecommunication systems are numerous. Reduced test development time, low test application time, eliminating the need for very-high-speed hardware testers, provision for at-speed tests, in-field test capability, and high fault coverage are some of them. In this article we present a tutorial on the BIST methodology targeted mainly toward telecommunication systems, the test structures necessary for its incorporation both at the circuit and system levels, and test implementation at the higher levels of design abstraction.

AB - The technological revolution witnessed by the telecommunications industry is leading to the development of new applications, products, and protocols, which in turn solicits widely accessible, highly reliable, and high-quality networks. To meet the stringent quality and reliability requirements of today's complex communication networks, efficient test methodologies are necessary at all levels (system, board, circuit, etc.). Conventional test methodologies are being constantly challenged by ever-increasing speed and circuit size, which results in high costs associated with test hardware, test generation, and test application time. Built-in self-test offers a test methodology where the test functions are embedded into the circuit itself. The advantages of using BIST for complex telecommunication systems are numerous. Reduced test development time, low test application time, eliminating the need for very-high-speed hardware testers, provision for at-speed tests, in-field test capability, and high fault coverage are some of them. In this article we present a tutorial on the BIST methodology targeted mainly toward telecommunication systems, the test structures necessary for its incorporation both at the circuit and system levels, and test implementation at the higher levels of design abstraction.

UR - http://www.scopus.com/inward/record.url?scp=0032689160&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0032689160&partnerID=8YFLogxK

U2 - 10.1109/35.769277

DO - 10.1109/35.769277

M3 - Article

AN - SCOPUS:0032689160

VL - 37

SP - 72

EP - 78

JO - IEEE Communications Magazine

JF - IEEE Communications Magazine

SN - 0163-6804

IS - 6

ER -