Attacking split manufacturing from a deep learning perspective

Haocheng Li, Satwik Patnaik, Abhrajit Sengupta, Haoyu Yang, Johann Knechtel, Bei Yu, Evangeline F.Y. Young, Ozgur Sinanoglu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The notion of integrated circuit split manufacturing which delegates the front-end-of-line (FEOL) and back-end-of-line (BEOL) parts to different foundries, is to prevent overproduction, piracy of the intellectual property (IP), or targeted insertion of hardware Trojans by adversaries in the FEOL facility. In this work, we challenge the security promise of split manufacturing by formulating various layout-level placement and routing hints as vector- and imagebased features. We construct a sophisticated deep neural network which can infer the missing BEOL connections with high accuracy. Compared with the publicly available network-flow attack [1], for the same set of ISCAS-85 benchmarks, we achieve 1.21× accuracy when splitting on M1 and 1.12× accuracy when splitting on M3 with less than 1% running time.

Original languageEnglish (US)
Title of host publicationProceedings of the 56th Annual Design Automation Conference 2019, DAC 2019
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781450367257
DOIs
StatePublished - Jun 2 2019
Event56th Annual Design Automation Conference, DAC 2019 - Las Vegas, United States
Duration: Jun 2 2019Jun 6 2019

Publication series

NameProceedings - Design Automation Conference
ISSN (Print)0738-100X

Conference

Conference56th Annual Design Automation Conference, DAC 2019
CountryUnited States
CityLas Vegas
Period6/2/196/6/19

Fingerprint

Manufacturing
Line
Intellectual property
Foundries
Integrated circuits
Hardware
Intellectual Property
Network Flow
Integrated Circuits
Placement
Insertion
Layout
High Accuracy
Routing
Attack
Neural Networks
Benchmark
Learning
Deep learning
Deep neural networks

ASJC Scopus subject areas

  • Computer Science Applications
  • Control and Systems Engineering
  • Electrical and Electronic Engineering
  • Modeling and Simulation

Cite this

Li, H., Patnaik, S., Sengupta, A., Yang, H., Knechtel, J., Yu, B., ... Sinanoglu, O. (2019). Attacking split manufacturing from a deep learning perspective. In Proceedings of the 56th Annual Design Automation Conference 2019, DAC 2019 [a135] (Proceedings - Design Automation Conference). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1145/3316781.3317780

Attacking split manufacturing from a deep learning perspective. / Li, Haocheng; Patnaik, Satwik; Sengupta, Abhrajit; Yang, Haoyu; Knechtel, Johann; Yu, Bei; Young, Evangeline F.Y.; Sinanoglu, Ozgur.

Proceedings of the 56th Annual Design Automation Conference 2019, DAC 2019. Institute of Electrical and Electronics Engineers Inc., 2019. a135 (Proceedings - Design Automation Conference).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Li, H, Patnaik, S, Sengupta, A, Yang, H, Knechtel, J, Yu, B, Young, EFY & Sinanoglu, O 2019, Attacking split manufacturing from a deep learning perspective. in Proceedings of the 56th Annual Design Automation Conference 2019, DAC 2019., a135, Proceedings - Design Automation Conference, Institute of Electrical and Electronics Engineers Inc., 56th Annual Design Automation Conference, DAC 2019, Las Vegas, United States, 6/2/19. https://doi.org/10.1145/3316781.3317780
Li H, Patnaik S, Sengupta A, Yang H, Knechtel J, Yu B et al. Attacking split manufacturing from a deep learning perspective. In Proceedings of the 56th Annual Design Automation Conference 2019, DAC 2019. Institute of Electrical and Electronics Engineers Inc. 2019. a135. (Proceedings - Design Automation Conference). https://doi.org/10.1145/3316781.3317780
Li, Haocheng ; Patnaik, Satwik ; Sengupta, Abhrajit ; Yang, Haoyu ; Knechtel, Johann ; Yu, Bei ; Young, Evangeline F.Y. ; Sinanoglu, Ozgur. / Attacking split manufacturing from a deep learning perspective. Proceedings of the 56th Annual Design Automation Conference 2019, DAC 2019. Institute of Electrical and Electronics Engineers Inc., 2019. (Proceedings - Design Automation Conference).
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