Atomic force microscope studies of membranes: Surface pore structures of Diaflo ultrafiltration membranes

W. Richard Bowen, Nidal Hilal, Robert W. Lovitt, Peter M. Williams

Research output: Contribution to journalArticle

Abstract

Noncontact atomic force microscopy (AFM) has been used to investigate the surface pore structure of eight Diaflo ultrafiltration membranes covering a range of nominal molecular weight cutoff (MWCO) from 3000 to 300,000 and manufactured from three different polymer types. Excellent high resolution images were obtained. Analysis of the pore images gave quantitative information on the surface pore structure, in particular the pore size distribution and surface roughness. Such data is compared to that obtained by other techniques. Noncontact AFM is a facile and informative means of studying the surface structure of porous materials such as synthetic membranes.

Original languageEnglish (US)
Pages (from-to)350-359
Number of pages10
JournalJournal of Colloid and Interface Science
Volume180
Issue number2
DOIs
StatePublished - Jun 25 1996

Fingerprint

Ultrafiltration
Pore structure
Atomic force microscopy
Microscopes
Membranes
Image resolution
Surface structure
Pore size
Porous materials
Polymers
Surface roughness
Molecular weight

Keywords

  • atomic force microscopy
  • pore size distribution
  • ultrafiltration

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Biomaterials
  • Surfaces, Coatings and Films
  • Colloid and Surface Chemistry

Cite this

Atomic force microscope studies of membranes : Surface pore structures of Diaflo ultrafiltration membranes. / Bowen, W. Richard; Hilal, Nidal; Lovitt, Robert W.; Williams, Peter M.

In: Journal of Colloid and Interface Science, Vol. 180, No. 2, 25.06.1996, p. 350-359.

Research output: Contribution to journalArticle

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