Atomic force microscope studies of membranes

Force measurement and imaging in electrolyte solutions

W. Richard Bowen, Nidal Hilal, Robert W. Lovitt, Adel O. Sharif, Peter M. Williams

    Research output: Contribution to journalArticle

    Abstract

    An atomic force microscope has been used to study the electrical double layer interactions between a silicon tip (with an oxidised surface) and two polymeric membranes, one microfiltration (nominally 0.1μm) and the other ultrafiltration (25,000 MWCO), in aqueous NaCl solutions. Force-distance curves were measured for the two membranes at four ionic strengths. The membranes were also imaged under the same conditions using electrical double layer repulsive forces of differing magnitudes - 'electrical double layer mode' imaging. Image analysis was used to determine surface pore size distributions. The force distance curves, together with numerically calculated potential profiles at the entrance to a charged pore, allow an explanation and identification of the optimum imaging conditions. The best images were obtained at high ionic strength with the tip close to the membrane.

    Original languageEnglish (US)
    Pages (from-to)77-89
    Number of pages13
    JournalJournal of Membrane Science
    Volume126
    Issue number1
    DOIs
    StatePublished - Apr 2 1997

    Fingerprint

    Force measurement
    Electrolytes
    Microscopes
    microscopes
    electrolytes
    membranes
    Ionic strength
    Membranes
    Imaging techniques
    Osmolar Concentration
    Polymeric membranes
    Microfiltration
    Silicon
    Ultrafiltration
    porosity
    Image analysis
    Pore size
    curves
    image analysis
    entrances

    Keywords

    • Atomic force microscopy
    • Electrical double layer
    • Microfiltration
    • Pore size distribution
    • Surface forces
    • Ultrafiltration

    ASJC Scopus subject areas

    • Biochemistry
    • Materials Science(all)
    • Physical and Theoretical Chemistry
    • Filtration and Separation

    Cite this

    Atomic force microscope studies of membranes : Force measurement and imaging in electrolyte solutions. / Bowen, W. Richard; Hilal, Nidal; Lovitt, Robert W.; Sharif, Adel O.; Williams, Peter M.

    In: Journal of Membrane Science, Vol. 126, No. 1, 02.04.1997, p. 77-89.

    Research output: Contribution to journalArticle

    Bowen, W. Richard ; Hilal, Nidal ; Lovitt, Robert W. ; Sharif, Adel O. ; Williams, Peter M. / Atomic force microscope studies of membranes : Force measurement and imaging in electrolyte solutions. In: Journal of Membrane Science. 1997 ; Vol. 126, No. 1. pp. 77-89.
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