Area-efficient fault detection during self-recovering microarchitecture synthesis

Ramesh Karri, Alex Orailoglu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We will present the area-efficient fault-detection synthesis component of SYNCERE, an integrated system for synthesizing area-efficient self-recovering microarchitectures. In the SYNCERE model for self-recovery, transient fault detection is based on duplication and comparison, while recovery from transient faults is accomplished via checkpointing and rollback. SYNCERE minimizes the overhead of duplication using two complementary area-optimization techniques. Whereas imposing inter-copy hardware disjointness at a sub-computation level instead of at the overall computation level ameliorates the dedicated hardware required for the original and duplicate computations, restructuring the pliable input representation of the duplicate computation further moderates the overall hardware.

Original languageEnglish (US)
Title of host publicationProceedings - Design Automation Conference
PublisherIEEE
Pages552-556
Number of pages5
StatePublished - 1994
EventProceedings of the 31st Design Automation Conference - San Diego, CA, USA
Duration: Jun 6 1994Jun 10 1994

Other

OtherProceedings of the 31st Design Automation Conference
CitySan Diego, CA, USA
Period6/6/946/10/94

Fingerprint

Fault detection
Hardware
Recovery

ASJC Scopus subject areas

  • Hardware and Architecture
  • Control and Systems Engineering

Cite this

Karri, R., & Orailoglu, A. (1994). Area-efficient fault detection during self-recovering microarchitecture synthesis. In Proceedings - Design Automation Conference (pp. 552-556). IEEE.

Area-efficient fault detection during self-recovering microarchitecture synthesis. / Karri, Ramesh; Orailoglu, Alex.

Proceedings - Design Automation Conference. IEEE, 1994. p. 552-556.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Karri, R & Orailoglu, A 1994, Area-efficient fault detection during self-recovering microarchitecture synthesis. in Proceedings - Design Automation Conference. IEEE, pp. 552-556, Proceedings of the 31st Design Automation Conference, San Diego, CA, USA, 6/6/94.
Karri R, Orailoglu A. Area-efficient fault detection during self-recovering microarchitecture synthesis. In Proceedings - Design Automation Conference. IEEE. 1994. p. 552-556
Karri, Ramesh ; Orailoglu, Alex. / Area-efficient fault detection during self-recovering microarchitecture synthesis. Proceedings - Design Automation Conference. IEEE, 1994. pp. 552-556
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