Applying IC testing concepts to secure ICs

Jeyavijayan Rajendran, Y Pino, Ozgur Sinanoglu, Ramesh Karri

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish (US)
Title of host publicationProceedings of the Government Microcircuit Applications and Critical Technology
StatePublished - Mar 2012

Cite this

Rajendran, J., Pino, Y., Sinanoglu, O., & Karri, R. (2012). Applying IC testing concepts to secure ICs. In Proceedings of the Government Microcircuit Applications and Critical Technology

Applying IC testing concepts to secure ICs. / Rajendran, Jeyavijayan; Pino, Y; Sinanoglu, Ozgur; Karri, Ramesh.

Proceedings of the Government Microcircuit Applications and Critical Technology. 2012.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Rajendran, J, Pino, Y, Sinanoglu, O & Karri, R 2012, Applying IC testing concepts to secure ICs. in Proceedings of the Government Microcircuit Applications and Critical Technology.
Rajendran J, Pino Y, Sinanoglu O, Karri R. Applying IC testing concepts to secure ICs. In Proceedings of the Government Microcircuit Applications and Critical Technology. 2012
Rajendran, Jeyavijayan ; Pino, Y ; Sinanoglu, Ozgur ; Karri, Ramesh. / Applying IC testing concepts to secure ICs. Proceedings of the Government Microcircuit Applications and Critical Technology. 2012.
@inproceedings{e340fc96a94641e097bebdf021a4b226,
title = "Applying IC testing concepts to secure ICs",
author = "Jeyavijayan Rajendran and Y Pino and Ozgur Sinanoglu and Ramesh Karri",
year = "2012",
month = "3",
language = "English (US)",
booktitle = "Proceedings of the Government Microcircuit Applications and Critical Technology",

}

TY - GEN

T1 - Applying IC testing concepts to secure ICs

AU - Rajendran, Jeyavijayan

AU - Pino, Y

AU - Sinanoglu, Ozgur

AU - Karri, Ramesh

PY - 2012/3

Y1 - 2012/3

M3 - Conference contribution

BT - Proceedings of the Government Microcircuit Applications and Critical Technology

ER -