Angle-dependent photoluminescence spectra of hydrogenated amorphous silicon thin films

D. C. Marra, Eray Aydil, S. J. Joo, E. Yoon, V. I. Srdanov

Research output: Contribution to journalArticle

Abstract

Multiple sharp peaks were observed in the visible photoluminescence spectra of amorphous silicon thin films, prepared by ultrahigh vacuum electron cyclotron resonance chemical vapor deposition on oxidized silicon substrates. The angular dependence of the photoluminescence, measured by a home-built fiber-optics device, revealed that the origin of these sharp features was due to Fabry-Pérot cavity interference effects. The interference is enhanced by deposition on thermally grown oxide layers with relatively smooth surfaces. We also consider how thin-film interference effects can add to the already existing confusion regarding the photoluminescence (PL) mechanism of porous and other luminescent forms of silicon and propose angle-dependent PL spectroscopy as a remedy for identifying spectral features due to interference effects.

Original languageEnglish (US)
Pages (from-to)3346-3348
Number of pages3
JournalApplied Physics Letters
Volume77
Issue number21
DOIs
StatePublished - Nov 20 2000

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amorphous silicon
photoluminescence
interference
thin films
confusion
silicon
electron cyclotron resonance
ultrahigh vacuum
fiber optics
vapor deposition
cavities
oxides
spectroscopy

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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Angle-dependent photoluminescence spectra of hydrogenated amorphous silicon thin films. / Marra, D. C.; Aydil, Eray; Joo, S. J.; Yoon, E.; Srdanov, V. I.

In: Applied Physics Letters, Vol. 77, No. 21, 20.11.2000, p. 3346-3348.

Research output: Contribution to journalArticle

Marra, D. C. ; Aydil, Eray ; Joo, S. J. ; Yoon, E. ; Srdanov, V. I. / Angle-dependent photoluminescence spectra of hydrogenated amorphous silicon thin films. In: Applied Physics Letters. 2000 ; Vol. 77, No. 21. pp. 3346-3348.
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