Analysis of the test data volume reduction benefit of modular SOC testing

Ozgur Sinanoglu, Erik Jan Manmssen

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Modular SOC testing offers numerous benefits that include test power reduction, ease of timing closure, and test re-use among many others. While all these benefits have been emphasized by researchers, the test time and data volume comparisons has been mostly constrained within the context of modular SOC testing only, by comparing the impact of various different modular SOC testing techniques to each other. In this paper, we provide a theoretical test data volume analysis that compares the monolithic test of a flattened design with the same design tested in a modular manner; we present numerous experiments that gauge the magnitude of this benefit. We show that the test data volume reduction delivered by modular SOC testing directly hinges on the test pattern count variation across different modules, and that this reduction can exceed 99% in the SOC benchmarks that we have experimented with.

Original languageEnglish (US)
Title of host publicationDesign, Automation and Test in Europe, DATE 2008
Pages182-187
Number of pages6
DOIs
StatePublished - Aug 25 2008
EventDesign, Automation and Test in Europe, DATE 2008 - Munich, Germany
Duration: Mar 10 2008Mar 14 2008

Other

OtherDesign, Automation and Test in Europe, DATE 2008
CountryGermany
CityMunich
Period3/10/083/14/08

Fingerprint

Testing
Hinges
Gages
Experiments

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Sinanoglu, O., & Manmssen, E. J. (2008). Analysis of the test data volume reduction benefit of modular SOC testing. In Design, Automation and Test in Europe, DATE 2008 (pp. 182-187). [4484683] https://doi.org/10.1109/DATE.2008.4484683

Analysis of the test data volume reduction benefit of modular SOC testing. / Sinanoglu, Ozgur; Manmssen, Erik Jan.

Design, Automation and Test in Europe, DATE 2008. 2008. p. 182-187 4484683.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Sinanoglu, O & Manmssen, EJ 2008, Analysis of the test data volume reduction benefit of modular SOC testing. in Design, Automation and Test in Europe, DATE 2008., 4484683, pp. 182-187, Design, Automation and Test in Europe, DATE 2008, Munich, Germany, 3/10/08. https://doi.org/10.1109/DATE.2008.4484683
Sinanoglu O, Manmssen EJ. Analysis of the test data volume reduction benefit of modular SOC testing. In Design, Automation and Test in Europe, DATE 2008. 2008. p. 182-187. 4484683 https://doi.org/10.1109/DATE.2008.4484683
Sinanoglu, Ozgur ; Manmssen, Erik Jan. / Analysis of the test data volume reduction benefit of modular SOC testing. Design, Automation and Test in Europe, DATE 2008. 2008. pp. 182-187
@inproceedings{be228486753244059b4b8fecf733abff,
title = "Analysis of the test data volume reduction benefit of modular SOC testing",
abstract = "Modular SOC testing offers numerous benefits that include test power reduction, ease of timing closure, and test re-use among many others. While all these benefits have been emphasized by researchers, the test time and data volume comparisons has been mostly constrained within the context of modular SOC testing only, by comparing the impact of various different modular SOC testing techniques to each other. In this paper, we provide a theoretical test data volume analysis that compares the monolithic test of a flattened design with the same design tested in a modular manner; we present numerous experiments that gauge the magnitude of this benefit. We show that the test data volume reduction delivered by modular SOC testing directly hinges on the test pattern count variation across different modules, and that this reduction can exceed 99{\%} in the SOC benchmarks that we have experimented with.",
author = "Ozgur Sinanoglu and Manmssen, {Erik Jan}",
year = "2008",
month = "8",
day = "25",
doi = "10.1109/DATE.2008.4484683",
language = "English (US)",
isbn = "9783981080",
pages = "182--187",
booktitle = "Design, Automation and Test in Europe, DATE 2008",

}

TY - GEN

T1 - Analysis of the test data volume reduction benefit of modular SOC testing

AU - Sinanoglu, Ozgur

AU - Manmssen, Erik Jan

PY - 2008/8/25

Y1 - 2008/8/25

N2 - Modular SOC testing offers numerous benefits that include test power reduction, ease of timing closure, and test re-use among many others. While all these benefits have been emphasized by researchers, the test time and data volume comparisons has been mostly constrained within the context of modular SOC testing only, by comparing the impact of various different modular SOC testing techniques to each other. In this paper, we provide a theoretical test data volume analysis that compares the monolithic test of a flattened design with the same design tested in a modular manner; we present numerous experiments that gauge the magnitude of this benefit. We show that the test data volume reduction delivered by modular SOC testing directly hinges on the test pattern count variation across different modules, and that this reduction can exceed 99% in the SOC benchmarks that we have experimented with.

AB - Modular SOC testing offers numerous benefits that include test power reduction, ease of timing closure, and test re-use among many others. While all these benefits have been emphasized by researchers, the test time and data volume comparisons has been mostly constrained within the context of modular SOC testing only, by comparing the impact of various different modular SOC testing techniques to each other. In this paper, we provide a theoretical test data volume analysis that compares the monolithic test of a flattened design with the same design tested in a modular manner; we present numerous experiments that gauge the magnitude of this benefit. We show that the test data volume reduction delivered by modular SOC testing directly hinges on the test pattern count variation across different modules, and that this reduction can exceed 99% in the SOC benchmarks that we have experimented with.

UR - http://www.scopus.com/inward/record.url?scp=47849112520&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=47849112520&partnerID=8YFLogxK

U2 - 10.1109/DATE.2008.4484683

DO - 10.1109/DATE.2008.4484683

M3 - Conference contribution

AN - SCOPUS:47849112520

SN - 9783981080

SN - 9789783981089

SP - 182

EP - 187

BT - Design, Automation and Test in Europe, DATE 2008

ER -