Analysis and simulation for a model of electron impact excitation/deexcitation and ionization/recombination

Bokai Yan, Russel Caflisch, Farzin Barekat, Jean Luc Cambier

Research output: Contribution to journalArticle

Abstract

This paper describes a kinetic model and a corresponding Monte Carlo simulation method for excitation/deexcitation and ionization/recombination by electron impact in a plasma free of external fields. The atoms and ions in the plasma are represented by continuum densities and the electrons by a particle distribution. A Boltzmann-type equation is formulated and a corresponding H-theorem is formally derived. An efficient Monte Carlo method is developed for an idealized analytic model of the excitation and ionization collision cross sections. To accelerate the simulation, the reduced rejection method and binary search method are used to overcome the singular rate in the recombination process. Numerical results are presented to demonstrate the efficiency of the method on spatially homogeneous problems. The evolution of the electron distribution function and atomic states is studied, revealing the possibility under certain circumstances of system relaxation towards stationary states that are not the equilibrium states, a potential non-ergodic behavior.

Original languageEnglish (US)
Pages (from-to)747-786
Number of pages40
JournalJournal of Computational Physics
Volume299
DOIs
StatePublished - Oct 5 2015

Fingerprint

electron impact
Ionization
ionization
Electrons
electron distribution
rejection
excitation
Monte Carlo method
Plasmas
simulation
theorems
distribution functions
continuums
collisions
Distribution functions
cross sections
kinetics
Monte Carlo methods
atoms
Atoms

Keywords

  • Boltzmann equation
  • Excitation-deexcitation
  • H theorem
  • Ionization-recombination
  • Monte Carlo method
  • Singular reaction rates

ASJC Scopus subject areas

  • Computer Science Applications
  • Physics and Astronomy (miscellaneous)

Cite this

Analysis and simulation for a model of electron impact excitation/deexcitation and ionization/recombination. / Yan, Bokai; Caflisch, Russel; Barekat, Farzin; Cambier, Jean Luc.

In: Journal of Computational Physics, Vol. 299, 05.10.2015, p. 747-786.

Research output: Contribution to journalArticle

Yan, Bokai ; Caflisch, Russel ; Barekat, Farzin ; Cambier, Jean Luc. / Analysis and simulation for a model of electron impact excitation/deexcitation and ionization/recombination. In: Journal of Computational Physics. 2015 ; Vol. 299. pp. 747-786.
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