Align-Encode

Improving the encoding capability of test stimulus decompressors

Ozgur Sinanoglu

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Abstract

    While test stimulus compression helps reduce test time and data volume, and thus alleviates test costs, the delivery of certain test vectors may not be possible, leading to test quality degradation. Whether a test vector is encodable in the presence of a decompressor strongly hinges on the distribution ofits care bits. In this paper, wepresent a technique that provides an on-chip capability tojudiciously manipulate care bit distribution of a test vector We thus propose a hardware block, namely, Align-Encode, to be utilized along with any decompressor to boost the effectiveness ofthe decompressor. Align-Encode is reconfigured on a per pattern basis to delay the shift-in operations in selected scan chains, in order to align the scan slices in such a way that more test vectors become encodable. The reconfigurability ofAlign-Encode provides a test pattern independent solution, wherein any given set oftest vectors can be analyzed to compute the proper delay information. We map the delay computation problem to the maximal clique problem, and utilize an efficient heuristic to provide a near-optimal solution. Experimental results also justify the test pattern encodability enhancements that Align-Encode delivers, enabling significant test quality improvements andlor test cost reductions even when used with simple decompressors.

    Original languageEnglish (US)
    Title of host publicationProceedings - International Test Conference 2008, ITC 2008
    DOIs
    StatePublished - Dec 1 2008
    EventInternational Test Conference 2008, ITC 2008 - Santa Clara, CA, United States
    Duration: Oct 28 2008Oct 30 2008

    Other

    OtherInternational Test Conference 2008, ITC 2008
    CountryUnited States
    CitySanta Clara, CA
    Period10/28/0810/30/08

    Fingerprint

    Encoding
    Hinges
    Cost reduction
    Hardware
    Degradation
    Reconfigurability
    Maximal Clique
    Quality Improvement
    Costs
    Slice
    Justify
    Chip
    Compression
    Enhancement
    Optimal Solution
    Heuristics
    Experimental Results

    ASJC Scopus subject areas

    • Applied Mathematics
    • Electrical and Electronic Engineering

    Cite this

    Sinanoglu, O. (2008). Align-Encode: Improving the encoding capability of test stimulus decompressors. In Proceedings - International Test Conference 2008, ITC 2008 [4700647] https://doi.org/10.1109/TEST.2008.4700647

    Align-Encode : Improving the encoding capability of test stimulus decompressors. / Sinanoglu, Ozgur.

    Proceedings - International Test Conference 2008, ITC 2008. 2008. 4700647.

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Sinanoglu, O 2008, Align-Encode: Improving the encoding capability of test stimulus decompressors. in Proceedings - International Test Conference 2008, ITC 2008., 4700647, International Test Conference 2008, ITC 2008, Santa Clara, CA, United States, 10/28/08. https://doi.org/10.1109/TEST.2008.4700647
    Sinanoglu O. Align-Encode: Improving the encoding capability of test stimulus decompressors. In Proceedings - International Test Conference 2008, ITC 2008. 2008. 4700647 https://doi.org/10.1109/TEST.2008.4700647
    Sinanoglu, Ozgur. / Align-Encode : Improving the encoding capability of test stimulus decompressors. Proceedings - International Test Conference 2008, ITC 2008. 2008.
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