A semi-empirical method for the calculation of cross sections for the electron-impact ionization of negatively charged fullerenes

Paul Scheier, H. Deutsch, K. Becker, T. D. Märk

Research output: Contribution to journalArticle

Abstract

We extended our previously developed semi-empirical method for the calculation of cross section functions (absolute value and energy dependence) for the electron-impact ionization of the neutral fullerenes C60 and C70 and of the ionized fullerenes C60 q+ (q=1-3) to the calculation of multiple ionization processes of the negatively charged fullerenes Cm - (m=60, 70, and 84). Systematic trends and tendencies are highlighted and a detailed comparison with available experimental data is made. Predictions are also made for cross sections for the ionization of the neutral fullerene C84 up to charge state z=6. An attempt is made to elucidate the origin of an experimentally observed scaling law that relates the ratio of the measured ionization cross sections of different fullerenes m and m′, σ-1,z(m)/σ-1,z(m′), where the subscript "-1" refers to the fact that the initial target is negatively charged and "z" denotes the charge state of the final ion, to the corresponding ratio of the geometric cross sections σgeom(m)/σgeom(m′) to the power "z".

Original languageEnglish (US)
Pages (from-to)703-711
Number of pages9
JournalInternational Journal of Mass Spectrometry
Volume223-224
DOIs
StatePublished - Jan 15 2003

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Fullerenes
Impact ionization
electron impact
fullerenes
Ionization
ionization
Electrons
cross sections
Scaling laws
ionization cross sections
scaling laws
Ions
tendencies
trends
predictions
ions

Keywords

  • Cluster
  • Electron impact
  • Fullerenes
  • Ionization cross sections

ASJC Scopus subject areas

  • Physical and Theoretical Chemistry
  • Spectroscopy

Cite this

A semi-empirical method for the calculation of cross sections for the electron-impact ionization of negatively charged fullerenes. / Scheier, Paul; Deutsch, H.; Becker, K.; Märk, T. D.

In: International Journal of Mass Spectrometry, Vol. 223-224, 15.01.2003, p. 703-711.

Research output: Contribution to journalArticle

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